Automated requirements-based generation of test cases for product families - Nebut, Clémentine; Pickin, Simon; Traon, Yves Le; Jézéquel, Jean-Marc (18th IEEE International Conference on Automated Software Engineering, 2003. Proceedings, 2003)
Keywords: Automatic test pattern generation; Automatic testing; Automation; Computer aided software engineering; Defense industry; Software and its engineering; Software and its engineering -- Software creation and management; Software and its engineering -- Software creation and management -- Software verification and validation; Software and its engineering -- Software creation and management -- Software verification and validation -- Software defect analysis; Software and its engineering -- Software creation and management -- Software verification and validation -- Software defect analysis -- Software testing and debugging; Software engineering; Software testing; Subcontracting; Test pattern generators; Unified modeling language