A technology-independent CAD tool for ESD protection device extraction ESDExtractor

• Published in: Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design pp. 510 - 513
• Main Authors: Zhan, R. Y., Feng, H. G., Wu, Q., Chen, G., Guan, X. K., Wang, Albert. Z.
• Format: Conference Proceeding
• Language: English
• Published: New York, NY, USA ACM 10.11.2002; IEEE
• Series: ACM Conferences
• Subjects: Applied computing > Arts and humanities > Architecture (buildings) > Computer-aided design; Applied computing > Physical sciences and engineering > Engineering > Computer-aided design; Applied sciences; Computing methodologies > Symbolic and algebraic manipulation > Symbolic and algebraic algorithms; Design. Technologies. Operation analysis. Testing; Electronics; Exact sciences and technology; Hardware > Hardware validation > Functional verification > Simulation and emulation; Integrated circuits; Microelectronic fabrication (materials and surfaces technology); Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Theory of computation > Design and analysis of algorithms; Performance evaluation; Microelectronic fabrication; Patterning; Integrated circuit layout; Circuit design; Electrostatic discharge; Protective device; Algorithm; Computer aided design; Implementation
• ISBN: 0780376072; 9780780376076
• ISSN: 1092-3152
• DOI: 10.1145/774572.774647

The challenges for developing an ESD (Electro-static Discharge) layout extractor originate from unconventional layout patterns of ESD protection devices, parasitic ESD device extraction and device count reduction. This paper reports a new technology-independent layout extractor, ESDExtractor, which is capable of extracting all types of ESD devices and answers the demands for ESD design verification. General methodology to extract both intentional and parasitic ESD devices, specific algorithms and implementation methods for efficiencyenhancement are presented, followed by a design example.