Thermally robust clocking schemes for 3D integrated circuits

3D integration of multiple active layers into a single chip is a viable technique that greatly reduces the length of global wires by providing vertical connections between layers. However, dissipating the heat generated in the 3D chips possesses a major challenge to the success of the technology and...

Full description

Saved in:
Bibliographic Details
Published inProceedings of the conference on Design, automation and test in Europe pp. 1206 - 1211
Main Authors Mondal, Mosin, Ricketts, Andrew J., Kirolos, Sami, Ragheb, Tamer, Link, Greg, Vijaykrishnan, N., Massoud, Yehia
Format Conference Proceeding
LanguageEnglish
Published San Jose, CA, USA EDA Consortium 16.04.2007
SeriesACM Conferences
Subjects
Online AccessGet full text
ISBN3981080122
9783981080124
DOI10.5555/1266366.1266626

Cover

Abstract 3D integration of multiple active layers into a single chip is a viable technique that greatly reduces the length of global wires by providing vertical connections between layers. However, dissipating the heat generated in the 3D chips possesses a major challenge to the success of the technology and is the subject of active current research. Since the generated heat degrades the performance of the chip, thermally insensitive/adaptive circuit design techniques are required for better overall system performance. In this paper, we propose a thermally adaptive 3D clocking scheme that dynamically adjusts the driving strengths of the clock buffers to reduce the clock skew between terminals. We investigate the relative merits and demerits of two alternative clock tree topologies in this work. Simulation results demonstrate that our adaptive technique is capable of reducing the skew by 61.65% on the average, leading to much improved clock synchronization and design performance in the 3D realm.
AbstractList 3D integration of multiple active layers into a single chip is a viable technique that greatly reduces the length of global wires by providing vertical connections between layers. However, dissipating the heat generated in the 3D chips possesses a major challenge to the success of the technology and is the subject of active current research. Since the generated heat degrades the performance of the chip, thermally insensitive/adaptive circuit design techniques are required for better overall system performance. In this paper, we propose a thermally adaptive 3D clocking scheme that dynamically adjusts the driving strengths of the clock buffers to reduce the clock skew between terminals. We investigate the relative merits and demerits of two alternative clock tree topologies in this work. Simulation results demonstrate that our adaptive technique is capable of reducing the skew by 61.65% on the average, leading to much improved clock synchronization and design performance in the 3D realm.
Author Ragheb, Tamer
Vijaykrishnan, N.
Massoud, Yehia
Link, Greg
Mondal, Mosin
Ricketts, Andrew J.
Kirolos, Sami
Author_xml – sequence: 1
  givenname: Mosin
  surname: Mondal
  fullname: Mondal, Mosin
  organization: Rice University, Houston, TX
– sequence: 2
  givenname: Andrew J.
  surname: Ricketts
  fullname: Ricketts, Andrew J.
  organization: Pennsylvania State University, University Park, PA
– sequence: 3
  givenname: Sami
  surname: Kirolos
  fullname: Kirolos, Sami
  organization: Rice University, Houston, TX
– sequence: 4
  givenname: Tamer
  surname: Ragheb
  fullname: Ragheb, Tamer
  organization: Rice University, Houston, TX
– sequence: 5
  givenname: Greg
  surname: Link
  fullname: Link, Greg
  organization: York College of Pennsylvania, York, PA
– sequence: 6
  givenname: N.
  surname: Vijaykrishnan
  fullname: Vijaykrishnan, N.
  organization: Pennsylvania State University, University Park, PA
– sequence: 7
  givenname: Yehia
  surname: Massoud
  fullname: Massoud, Yehia
  organization: Rice University, Houston, TX
BookMark eNqNj71OwzAURi0BErR0ZvXIknBtx44jsaDyK1ViKbPlXNttaBJLdjrw9qSiD8BZzvR90lmQyzGOnpA7BqWceWBcKaFUebLi6oIsRKMZaGCcX5NVzt8wI5qKyeaGPG73Pg22739oiu0xTxT7iIdu3NGMez_4TENMVDzTbpz8LtnJO4pdwmM35VtyFWyf_ersJfl6fdmu34vN59vH-mlTWCbrqRCVVhV6dDqA1JxxqDGAsyhBSC2krZkH55h0AgUPjjFrA1TYVA4gCCmWpPz7tTiYNsZDNgzMqdaca8251rSp82Ee3P9zIH4B2g9XPg
ContentType Conference Proceeding
DOI 10.5555/1266366.1266626
DatabaseTitleList
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EndPage 1211
GroupedDBID 6IE
6IF
6IK
6IL
6IN
AAJGR
AARBI
ACM
ADPZR
ALMA_UNASSIGNED_HOLDINGS
APO
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
GUFHI
IERZE
OCL
RIB
RIC
RIE
RIL
ID FETCH-LOGICAL-a157t-34864cecd8f05821207cf0dac5035835a71e0dd15d3c32fd11aaf04c94d00f353
ISBN 3981080122
9783981080124
IngestDate Wed Jan 31 06:47:12 EST 2024
Wed Jan 31 06:37:33 EST 2024
IsPeerReviewed false
IsScholarly true
Language English
LinkModel OpenURL
MeetingName DATE07: Design, Automation and Test in Europe
MergedId FETCHMERGED-LOGICAL-a157t-34864cecd8f05821207cf0dac5035835a71e0dd15d3c32fd11aaf04c94d00f353
PageCount 6
ParticipantIDs acm_books_10_5555_1266366_1266626_brief
acm_books_10_5555_1266366_1266626
PublicationCentury 2000
PublicationDate 20070416
PublicationDateYYYYMMDD 2007-04-16
PublicationDate_xml – month: 04
  year: 2007
  text: 20070416
  day: 16
PublicationDecade 2000
PublicationPlace San Jose, CA, USA
PublicationPlace_xml – name: San Jose, CA, USA
PublicationSeriesTitle ACM Conferences
PublicationTitle Proceedings of the conference on Design, automation and test in Europe
PublicationYear 2007
Publisher EDA Consortium
Publisher_xml – name: EDA Consortium
SSID ssj0000394159
Score 1.7400467
Snippet 3D integration of multiple active layers into a single chip is a viable technique that greatly reduces the length of global wires by providing vertical...
SourceID acm
SourceType Publisher
StartPage 1206
SubjectTerms Hardware
Hardware -- Emerging technologies
Hardware -- Hardware validation
Hardware -- Very large scale integration design
Networks
Networks -- Network types
Networks -- Network types -- Ad hoc networks
Networks -- Network types -- Ad hoc networks -- Mobile ad hoc networks
Title Thermally robust clocking schemes for 3D integrated circuits
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LbxMxELZoT3CiUEShICMhcYg22Gt7HxIXRIqqSkUcUqm3lZ-wokmk7OYAv56xvVmnUSQeOWwSa-WV_c2OxzPzjRF6m0tlSG2qTEktMu5ym0kpbKZdybWrDTGV5w5ffykub_jVrbhNCZmBXdKrqf51kFfyP6hCG-DqWbL_gOzYKTTAb8AXroAwXPeM34PrzNexsduG-vVI4PNRgFlIzwgJmpt-FUmKMWUS1gLv6Yi--D2xAVV9d_dzsl6pDdylYbX7EZwOAK-v7OTzEtks1ZkwE92u9abtR-sc9IQJ5wiAxujaRDVrQWP0fZfyKCdX05QDsAY13EUn9aJN4adv320IGc3lYkgk9lNrOxCi6x2-4n33RekjMZFdGX1qs4_haFLYa7RD7YmwuWV15bMfaSQtD9qV5qTYWal9dbpDq4CAj3dIgO3BimLqv2HbdoSOyopGht_ohSOsBgum9qSf8YGxLNP4n8eCUL7T93tdeotGL3bskfljdJpGjpMYnKAHdvkEPdopMvkUfRghxRFSvIUUD5BigBSzGU6Q4i2kp-jm88X802U2nJmRSSrKPmO8Kri22lSOeA50TkrtiIEXkTAB1rYsqSXGUGGYZrkzlErpCNc1N4Q4JtgzdLxcLe1zhMHwh-01jLfSjJvcSVUxaa1jtRKFVPQMvYHRN_596BrYS_oZaoYZaoYZOkPv_nhPo0Bq3Iu_6O0lephE6Bwd9-uNfQU2Ya9eB1h_A_0XW5g
linkProvider IEEE
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Proceedings+of+the+conference+on+Design%2C+automation+and+test+in+Europe&rft.atitle=Thermally+robust+clocking+schemes+for+3D+integrated+circuits&rft.au=Mondal%2C+Mosin&rft.au=Ricketts%2C+Andrew+J.&rft.au=Kirolos%2C+Sami&rft.au=Ragheb%2C+Tamer&rft.series=ACM+Conferences&rft.date=2007-04-16&rft.pub=EDA+Consortium&rft.isbn=3981080122&rft.spage=1206&rft.epage=1211&rft_id=info:doi/10.5555%2F1266366.1266626
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9783981080124/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9783981080124/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9783981080124/sc.gif&client=summon&freeimage=true