Constructing Ternary CdS–Graphene–TiO2 Hybrids on the Flatland of Graphene Oxide with Enhanced Visible-Light Photoactivity for Selective Transformation

• Published in: Journal of physical chemistry. C Vol. 116; no. 34; pp. 18023 - 18031
• Main Authors: Zhang, Nan, Zhang, Yanhui, Pan, Xiaoyang, Yang, Min-Quan, Xu, Yi-Jun
• Format: Journal Article
• Language: English
• Published: Columbus, OH American Chemical Society 30.08.2012
• Subjects: Chemistry; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Cross-disciplinary physics: materials science; rheology; Electrochemistry; Electrodes: preparations and properties; Electron paramagnetic resonance and relaxation; Exact sciences and technology; Fullerenes and related materials; diamonds, graphite; General and physical chemistry; Magnetic resonances and relaxations in condensed matter, mössbauer effect; Materials science; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures; Physics; Specific materials; Photoluminescence; Electron transfer; Electron hole pair; XRD; Aldehydes; Alcohols; Visible radiation; Charge carrier generation; Reaction mechanism; Oxidation; Scanning transmission electron microscopy; Charge transfer; Scanning electron microscopy; Band structure; Semiconductor materials; Photocatalysis; X-ray spectra; Dispersive spectrometry; Field emission electron microscopy; Lifetime; Composite materials; Transmission electron microscopy; Graphene; Morphology; Addition reaction; Porosity; Electron paramagnetic resonance; Surface area; Microstructure; Catalyst activity; Ultraviolet visible spectrometry

The ternary CdS–graphene–TiO2 hybrids (CdS–GR–TiO2) have been prepared through an in situ strategy on the flatland of graphene oxide (GO). The structure and properties have been characterized by a series of techniques, including X-ray diffraction (XRD), field-emission scanning electron microscopy (F...