MOSFET/TFET Mixed Power Clamp Circuit For ESD and Surge Protection
Yang, Zhaonian, Yue, Yaping, Pu, Shi, Yang, Xiaohan, Zhang, Yue
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
Modeling and Reliability Considerations of Over-Driving Active ESD Protection Clamp
Aharoni, Efraim, Parvin, Avi, Raskin, Yosef, Kairis, Victor
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
System Efficient ESD Design of IO ESD Protection
Deng, Feifan, Zhu, Xinyu, Yu, Fangjun, Chen, Yipeng, Shen, Hongyu, Dong, Shurong
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
Predicting the ESD window of GGNMOS using neural network
Zhu, Xinyu, Yu, Fangjun, Deng, Feifan, Chen, Yipeng, Dong, Shurong
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
Compact Model for Reverse TLP I-V Characteristics of ESD diodes
Khandelwal, Sourabh, Bavi, Danial
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
Study of RC-Diode ESD Protection Circuit for High-Frequency Applications
Lin, Chun-Yu, Li, Bo-Yan, Fu, Yi-Quan
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
Failure analysis of ESD-induced MOSFET gate oxide damages via step-by-step approach
Luo, Xia, Xu, Jiexuan, Xu, Xiaowei, Luo, Hongwei, Dai, Zongbei
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
An Improved Area-efficient Transient ESD Power Clamp
Xu, Qi-an, Xue, Zhan, Jiang, Zhongpeng, Song, Scott, Wu, Blacksmith, Cao, Kanyu
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
Novel Topological Layout for ESD protection for high-speed I/O applications
Ma, Qinling, Liang, Hailian
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
Novel Staircase Wave ESD Testing Method for Accurate Latch-Up Evaluation
Qi, Zhao, Shi, Yonggang, Qiao, Ming, Zhao, Fei, Zhang, Bo
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
ESD Protection Design for Fan-Out Panel-Level Packaging
Lin, Chun-Yu, Hsieh, Chia-You, Dai, Zih-Jyun, Lai, Yu-Hsuan
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
An Open Short De-Embedding Accuracy Correction Methodology for On-chip High-speed ESD and RF Component Characterization
Lu, Guangyi, Gao, Wei, Wang, Lihui, Gao, Xin, Li, Mei
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
Continuous ESD Monitoring System for Manufacturing
Xu, Patrick, Koo, Kwanghoi, Tang, Oscar, Tatman, Noah
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
ESD Verification of a 2.5D CoWoS Package Design
Cao, Sen, Wu, Chenfei, Zhou, Guohua, Ouyang, Keqing, Yan, Quan
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
Transmission Line Pulse Induced Breakdown of FinFETs
Yang, Xin, Qing, Yihong, Dong, Zuoyuan, Chang-Liao, Kuei-Shu, Qian, Yunhan, Zhang, Zijian, Liang, Fang, Luo, Chen, Wang, Chaolun, Liu, Zhiwei, Wu, Yongren, Tsai, Chihang, Wu, Xing
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
A Behavioral Model for ESD Self-Protection RF Switches in the SOI CMOS Technology
Liu, Jian, Peachey, Nathaniel
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
Novel Ring Silicon-Controlled Rectifier for ESD Protection of Low-Voltage Circuits
Yu, Fangjun, Zhu, Xinyu, Deng, Feifan, Chen, Yipeng, Dong, Shurong
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
Implementation of Dual-Collector NPN BJT-Based ESD Protection Devices with Uniform and High ESD Failure Current
Song, Jongkyu, Heo, Jin, Choi, Jangkyu, Kim, Jiho, Yoo, Jeahyun, Song, Jooyoung, Jeon, ChanHee
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding
New LVTSCR with low parasitic capacitance for RFICs ESD protection
Han, Aoran, Zhang, Yuxin, Xie, Tiantian, Li, Nanjin, Wang, Tao, Du, Feibo, Hou, Fei, Liu, Zhiwei, Luo, Xun
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Get full text
Published in 2022 International EOS/ESD Symposium on Design and System (IEDS) (09.11.2022)
Conference Proceeding