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A Physics-Based Model for ESD Protection Devices With Open Base BJT Configuration
Mousavi, Seyed Mostafa, Yan, Xin, Asadi, Reza, Mousavi, Mehdi, Bub, Sergei, Holland, Steffen, Beetner, Daryl G.
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Conference Proceeding
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TDDB of Sensitive High-K Gate Dielectrics - Revisited for CDM
Russ, Christian, Esmark, Kai, Huff, Patrick, Boehm, Anton, Langguth, Gernot, Ille, Adrien, Scholz, Mirko
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Bidirectional DIAC Devices with Two-Stage Triggering
Amato, Michael, Vashchenko, Vladislav
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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System CDM Modeling for High-Speed Interface Devices
Groppo, Emanuele, Gossner, Harald, Domanski, Krzysztof, Dua, Raj, Gong, Jian, Carn, Brett, Zia, Victor, Brederlow, Ralf
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Single Event Latch-up (SEL) Rate Prediction Methodology in Bulk FinFET Technology
Chiang, Tzu-Hao, Huang, Chien-Yao, Lin, Wun-Jie, Lee, Jam-Wem, Chen, Kuo-Ji, Song, Ming-Hsiang
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Substrate NPN Extraction from Capacitance Field Solver
Xu, Chuan, Rivard, Michael, Zhu, Yuanqing, Liu, William
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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An Efficient and Cost-effective Method to Detect and Analyze ESD CDM Risks in Designs
Ghosh, Subhadeep, Ray, Kaustav, Sankaralingam, Raj, Pok, Rith
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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ESD Protection Analysis for 3D NAND Internal Source Plate Discharge Circuit
Davis, James, Mitra, Souvick, Marr, Ken, O'Sullivan, Greg, Cerafogli, Chiara, Rabbani, Tania
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Accuracy Preserving Extensions to a PDK MOSFET Model for ESD Simulation
Zhou, Yujie, Rosenbaum, Elyse
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Influence of TVS Properties and Printed Circuit Board Design on System Level ESD Robustness for USB-C SuperSpeed data lines
Holland, Steffen, Lotfi, Nima, Pilaski, Martin, Laue, Burkhard, Seider, Stefan
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Secondary Discharges during FICDM Stress - Source & Solution
Verwoerd, Sheela, Sluiter, Sander, Bychikhin, Sergey, Meuse, Tom
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Consideration of waveform analysis and test methods for Charged Board Event
Sawada, Masanori, Fukuda, Yasuhiro, Miura, Hideaki, Sakashita, Yudai, Takenaka, Hiroshi
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Qualification Challenges of Conductive and Dissipative Plastics
Viheriakoski, Toni, Seppala, Pasi, Korpi, Sanja, Smallwood, Jeremy
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Can CC-TLP be used as an early Failure Analysis tool?
Troussier, Chloe, Bourgeat, Johan, Jacquier, Blaise
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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ESD-EOS-OVP Protection Network for Battery Pins
Vashchenko, Vladislav, Sarbishaei, Hossein, Kontos, Dimitrios, Shibkov, Andrei
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Intrinsic Inductance and Time-Dependent Resistance of the FI-CDM Spark
Maloney, Timothy J., Ensaf, Peyman, Hernandez, Marcos
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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A Statistical Explanation of CDM Qualification Variability
Smedes, Theo, Scheucher, Wolfgang, Verwoerd, Sheela, Verwijst, Joop
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Conference Proceeding