Modeling Novel Non-JTAG IEEE 1687-Like Architectures
Laisne, M., Crouch, A., Portolan, M., Keim, M., von Staudt, H. M., Abdalwahab, M., Van Treuren, B., Rearick, J.
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
A Sophisticated Memory Test Engine for LCD Display Drivers
Spang, O., von Staudt, H.-M., Wahl, M.G.
Published in 2007 Design, Automation & Test in Europe Conference & Exhibition (01.04.2007)
Published in 2007 Design, Automation & Test in Europe Conference & Exhibition (01.04.2007)
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Conference Proceeding
Trading Off Test Coverage and False Reject Risk of Self-Calibrating Self-Test Systems
von Staudt, H. M., Schwiderski, F.
Published in 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop (01.05.2012)
Published in 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop (01.05.2012)
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Conference Proceeding