The quest for stable circumbinary companions to post-common envelope sdB eclipsing binaries
Pulley, D., Faillace, G., Smith, D., Watkins, A., von Harrach, S.
Published in Astronomy and astrophysics (Berlin) (01.03.2018)
Published in Astronomy and astrophysics (Berlin) (01.03.2018)
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Journal Article
An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes
Harrach, HS von, Dona, P, Freitag, B, Soltau, H, Niculae, A, Rohde, M
Published in Microscopy and microanalysis (01.07.2009)
Published in Microscopy and microanalysis (01.07.2009)
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Journal Article
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
Kisielowski, C., Freitag, B., Bischoff, M., van Lin, H., Lazar, S., Knippels, G., Tiemeijer, P., van der Stam, M., von Harrach, S., Stekelenburg, M., Haider, M., Uhlemann, S., Müller, H., Hartel, P., Kabius, B., Miller, D., Petrov, I., Olson, E.A., Donchev, T., Kenik, E.A., Lupini, A.R., Bentley, J., Pennycook, S.J., Anderson, I.M., Minor, A.M., Schmid, A.K., Duden, T., Radmilovic, V., Ramasse, Q.M., Watanabe, M., Erni, R., Stach, E.A., Denes, P., Dahmen, U.
Published in Microscopy and microanalysis (01.10.2008)
Published in Microscopy and microanalysis (01.10.2008)
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Journal Article
An integrated multiple silicon drift detector system for transmission electron microscopes
Harrach, H S von, Dona, P, Freitag, B, Soltau, H, Niculae, A, Rohde, M
Published in Journal of physics. Conference series (01.07.2010)
Published in Journal of physics. Conference series (01.07.2010)
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Journal Article
High EDS Count Rates Achieved by Design Improvements for an Analytical Transmission Electron Microscope
Rowlands, N, Harrach, S von, Tyrrell, C, Uden, F van
Published in Microscopy and microanalysis (01.08.2006)
Published in Microscopy and microanalysis (01.08.2006)
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Journal Article
The quest for stable circumbinary companions to post-common envelope sdB eclipsing binaries: Does the observational evidence support their existence?
Pulley, D., Faillace, G., Smith, D., Watkins, A., von Harrach, S.
Published in Astronomy and astrophysics (Berlin) (01.03.2018)
Published in Astronomy and astrophysics (Berlin) (01.03.2018)
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Journal Article
The Optimization of EDX Performance in Tecnai TEMs
von Harrach, H.S., Freitag, B., Gerits, W., van Cappellen, E., Sandborg, A.
Published in Microscopy and microanalysis (01.08.2002)
Published in Microscopy and microanalysis (01.08.2002)
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Journal Article
Instrumental factors in high-resolution FEG STEM
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Journal Article
Conference Proceeding
Optimization of EDX performance in Tecnai TEMs
von Harrach, H.S, Freitag, B, Gerits, W, Sandborg, A
Published in Micron (Oxford, England : 1993) (01.01.2003)
Published in Micron (Oxford, England : 1993) (01.01.2003)
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Journal Article
Protruding microgripper with force amplification and parallel jaw motion for in-situ sample manipulation in SEM and FIB-machines
Krijnen, G., Haanstra, R., Potters, E., Berenschot, J.W., von Harrach, S., Elwenspoek, M.
Published in TRANSDUCERS '03. 12th International Conference on Solid-State Sensors, Actuators and Microsystems. Digest of Technical Papers (Cat. No.03TH8664) (2003)
Published in TRANSDUCERS '03. 12th International Conference on Solid-State Sensors, Actuators and Microsystems. Digest of Technical Papers (Cat. No.03TH8664) (2003)
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Conference Proceeding
Design of an Analytical TEM/STEM with 0.3 srad EDX Detection
Harrach, H S von, Tiemeijer, P C, Ringnalda, J
Published in Microscopy and microanalysis (01.08.2005)
Published in Microscopy and microanalysis (01.08.2005)
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Journal Article
Comparison of the Detection Limits of EDS and EELS in S/TEM
von Harrach, HS, Klenov, D, Freitag, B, Schlossmacher, P, Collins, PC, Fraser, HL
Published in Microscopy and microanalysis (01.07.2010)
Published in Microscopy and microanalysis (01.07.2010)
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Journal Article