Analysis of copper plasticity impact in TSV-middle and backside TSV-last fabrication processes
Wei Guo, Karmarkar, Aditya P., Xiaopeng Xu, Van der Plas, Geert, Van Huylenbroeck, Stefaan, Gonzalez, Mario, Absil, Philippe, El Sayed, Karim, Beyne, Eric
Published in 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) (01.05.2015)
Published in 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) (01.05.2015)
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Conference Proceeding
Analog and RF circuits in 45 nm CMOS and below: planar bulk versus FinFET
Wambacq, P., Verbruggen, B., Scheir, K., Borremans, J., De Heyn, V., Van der Plas, G., Mercha, A., Parvais, B., Subramanian, V., Jurczak, M., Decoutere, S., Donnay, S.
Published in 2006 European Solid-State Device Research Conference (01.09.2006)
Published in 2006 European Solid-State Device Research Conference (01.09.2006)
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Conference Proceeding
Low-Frequency Noise Assessment of CMOS Transistors with a Through-Silicon Via
Simoen, Eddy, Mercha, Abdelkarim, Van der Plas, Geert, Claeys, C.
Published in Meeting abstracts (Electrochemical Society) (01.08.2011)
Published in Meeting abstracts (Electrochemical Society) (01.08.2011)
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Journal Article
IMPROVEMENTS IN OR RELATING TO MICRO-MIRROR ARRAYS
SEVERI, Simone, VAN DER PLAS, Geert, ROTTENBERG, Xavier, ROCHUS, Veronique, JAYAPALA, Murali
Year of Publication 03.05.2017
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Year of Publication 03.05.2017
Patent
ESD protection design in active-lite interposer for 2.5 and 3D systems-in-package
Scholz, Mirko, Hellings, Geert, Shih-Hung Chen, Linten, Dimitri, Detalle, Mikael, Neve, Cesar Roda, Shibkov, A., La Manna, Antonio, van der Plas, Geert, Beyne, Eric
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
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Conference Proceeding
A 14-bit intrinsic accuracy Q super(2) random walk CMOS DAC
Van Der Plas, GAM, Vandenbussche, J, Sansen, W, Steyaert, MSJ, Gielen, GGE
Published in IEEE journal of solid-state circuits (01.12.1999)
Published in IEEE journal of solid-state circuits (01.12.1999)
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Journal Article
A CMOS multi-parameter biochemical microsensor with temperature control and signal interfacing
Lauwers, E.Y., Suls, J., Van Der Plas, G., Peeters, E., Gumbrecht, W., Maes, D., Van Steenkiste, F., Gielen, G.G., Sansen, W.M.
Published in 2001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC (Cat. No.01CH37177) (2001)
Published in 2001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC (Cat. No.01CH37177) (2001)
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Conference Proceeding
Journal Article
Method and system for measuring capacitance difference between capacitive elements
Mercha Abdelkarim, Van der Plas Geert, Anchlia Ankur, Miyamori Yuichi, Sawada Ken
Year of Publication 09.08.2016
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Year of Publication 09.08.2016
Patent