Autotuning of a TEM using minimum electron dose
Koster, A.J., de Ruijter, W.J., Van Den Bos, A., Van Der Mast, K.D.
Published in Ultramicroscopy (01.04.1989)
Published in Ultramicroscopy (01.04.1989)
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Journal Article
Preface
van der Mast, K.D., Program Committee, o˚Chairman
Published in Microelectronic engineering (01.12.1985)
Published in Microelectronic engineering (01.12.1985)
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Journal Article
Automatic control of a TEM for HREM
Koster, A.J., de Ruijter, W.J., van den Bos, A., van der Mast, K.D.
Published in Ultramicroscopy (1988)
Published in Ultramicroscopy (1988)
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Journal Article
Automatic control of a tem for biological applications
Hoekstra, T., Hoek, M., van Vliet, L., Koster, A.J., van der Mast, K.D.
Published in Ultramicroscopy (1988)
Published in Ultramicroscopy (1988)
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Journal Article
Autofocussing and autoalignment of a TEM
Koster, A.J., Swaan, R., Pijper, F.J., Heesterbeek, L.T.M., van der Mast, K.D.
Published in Ultramicroscopy (1986)
Published in Ultramicroscopy (1986)
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Journal Article
Gas ion source for focused beams
Barth, J.E., de Gruyter, C.B., Koets, E., Kruit, P., van der Leeden, P.E., Le Poole, J.B., van der Mast, K.D.
Published in Microelectronic engineering (01.12.1985)
Published in Microelectronic engineering (01.12.1985)
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Journal Article