Search Results - "van der Heide P, A W" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Systematic x-ray photoelectron spectroscopic study of La1−xSrx-based perovskite-type oxides

Systematic x-ray photoelectron spectroscopic study of La1−xSrx-based perovskite-type oxides

by van der Heide, P. A. W.
Published in Surface and interface analysis (01.05.2002)

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Journal Article

4d core hole formation in silver and its role in Ag − secondary ion formation/survival

4d core hole formation in silver and its role in Ag − secondary ion formation/survival

by van der Heide, P.A.W.
Published in Applied surface science (30.07.2006)

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Journal Article Conference Proceeding

Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1 keV Cs + impact

Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1 keV Cs + impact

by van der Heide, P.A.W.
Published in Applied surface science (30.07.2006)

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Journal Article Conference Proceeding

Topographic Correction of 3D SIMS Images

Topographic Correction of 3D SIMS Images

by Wagter, M. L., Clarke, A. H., Taylor, K. F., van der Heide, P. A. W., McIntyre, N. S.
Published in Surface and interface analysis (01.09.1997)

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Journal Article

Oxidation Kinetics of Mg-, Si-, and Fe-Implanted Aluminum by Using X-ray Photoelectron Spectroscopy

Oxidation Kinetics of Mg-, Si-, and Fe-Implanted Aluminum by Using X-ray Photoelectron Spectroscopy

by Do, T, McIntyre, N. S, van der Heide, P. A. W, Akano, U. G
Published in The journal of physical chemistry. B (01.04.1999)

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Journal Article

A systematic study of the characteristic velocities of the negative secondary ion emissions of H, O and matrix species from Sc, Ti, V, Co, Ni and Cu substrates

A systematic study of the characteristic velocities of the negative secondary ion emissions of H, O and matrix species from Sc, Ti, V, Co, Ni and Cu substrates

by van der Heide, P.A.W.
Published in Surface science (20.09.1996)

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Journal Article

Multiplet splitting patterns exhibited by the first row transition metal oxides in X-ray photoelectron spectroscopy

Multiplet splitting patterns exhibited by the first row transition metal oxides in X-ray photoelectron spectroscopy

by van der Heide, P.A.W.
Published in Journal of electron spectroscopy and related phenomena (01.07.2008)

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Journal Article

Incorporation of Titanium into Mesoporous Silica Molecular Sieve SBA-15

Incorporation of Titanium into Mesoporous Silica Molecular Sieve SBA-15

by Luan, Zhaohua, Maes, Estelle M, van der Heide, Paul A. W, Zhao, Dongyuan, Czernuszewicz, Roman S, Kevan, Larry
Published in Chemistry of materials (20.12.1999)

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Journal Article

Quantitative SIMS analysis of trace Au in pyrite using the infinite velocity (IV) method

Quantitative SIMS analysis of trace Au in pyrite using the infinite velocity (IV) method

by Pratt, A.R., Huctwith, C.M., van der Heide, P.A.W., McIntyre, N.S.
Published in Journal of geochemical exploration (01.03.1998)

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Journal Article

Single-Molecule I2@US-Tube Nanocapsules: A New X-ray Contrast-Agent Design

Single-Molecule I2@US-Tube Nanocapsules: A New X-ray Contrast-Agent Design

by Ashcroft, J. M., Hartman, K. B., Kissell, K. R., Mackeyev, Y., Pheasant, S., Young, S., Van der Heide, P. A. W., Mikos, A. G., Wilson, L. J.
Published in Advanced materials (Weinheim) (19.02.2007)

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Journal Article

Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1keV Cs+ impact

Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1keV Cs+ impact

by van der Heide, P.A.W.
Published in Applied surface science (30.07.2006)

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Journal Article

X-ray photoelectron spectroscopic and ion scattering study of the SrTiO3(001) surface

X-ray photoelectron spectroscopic and ion scattering study of the SrTiO3(001) surface

by VAN DER HEIDE, P. A. W, JIANG, Q. D, KIM, Y. S, RABALAIS, J. W
Published in Surface science (10.02.2001)

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Journal Article

Single‐Molecule I 2 @US‐Tube Nanocapsules: A New X‐ray Contrast‐Agent Design

Single‐Molecule I 2 @US‐Tube Nanocapsules: A New X‐ray Contrast‐Agent Design

by Ashcroft, J. M., Hartman, K. B., Kissell, K. R., Mackeyev, Y., Pheasant, S., Young, S., Van der Heide, P. A. W., Mikos, A. G., Wilson, L. J.
Published in Advanced materials (Weinheim) (19.02.2007)

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Journal Article

Secondary ion formation/survival during the initial stages of sputtering Si and SiO2 with Cs

Secondary ion formation/survival during the initial stages of sputtering Si and SiO2 with Cs

by VAN DER HEIDE, P. A. W
Published in Surface science (20.04.2004)

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Journal Article

Secondary ion emission and work function measurements over the transient region from n and p type Si under Cs + irradiation

Secondary ion emission and work function measurements over the transient region from n and p type Si under Cs + irradiation

by van der Heide, P.A.W.
Published in Applied surface science (15.06.2004)

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Journal Article

Modes of surface exchange in La0.2Sr0.8Cr0.2Fe0.8O3-d

Modes of surface exchange in La0.2Sr0.8Cr0.2Fe0.8O3-d

by Mims, C A, Bayani, N, Jacobson, A J, Van Der Heide, P A W
Published in Solid state ionics (31.01.2005)

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Journal Article

Surface core level shifts in photo-electron spectra from the Ca, Sr and Ba titanates

Surface core level shifts in photo-electron spectra from the Ca, Sr and Ba titanates

by van der Heide, P.A.W.
Published in Surface science (10.09.2001)

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Journal Article

Systematic x‐ray photoelectron spectroscopic study of La 1− x Sr x ‐based perovskite‐type oxides

Systematic x‐ray photoelectron spectroscopic study of La 1− x Sr x ‐based perovskite‐type oxides

by van der Heide, P. A. W.
Published in Surface and interface analysis (01.05.2002)

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Journal Article

Work function, valence band and secondary ion intensity variations noted during the initial stages of SIMS depth profiling of Si and SiO2 by Cs

Work function, valence band and secondary ion intensity variations noted during the initial stages of SIMS depth profiling of Si and SiO2 by Cs

by VAN DER HEIDE, P. A. W, AZZARELLO, F. V
Published in Surface science (01.06.2003)

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Journal Article

Secondary ion emission from polycrystalline Al under Cs + irradiation

Secondary ion emission from polycrystalline Al under Cs + irradiation

by van der Heide, P.A.W.
Published in Applied surface science (15.06.2004)

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Journal Article