Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques
Gauquelin, N., van den Bos, K.H.W., Béché, A., Krause, F.F., Lobato, I., Lazar, S., Rosenauer, A., Van Aert, S., Verbeeck, J.
Published in Ultramicroscopy (01.10.2017)
Published in Ultramicroscopy (01.10.2017)
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Journal Article
Determination of the atomic width of an APB in ordered CoPt using quantified HAADF-STEM
Akamine, H., van den Bos, K.H.W., Gauquelin, N., Farjami, S., Van Aert, S., Schryvers, D., Nishida, M.
Published in Journal of alloys and compounds (25.09.2015)
Published in Journal of alloys and compounds (25.09.2015)
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Journal Article
The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterials
van den Bos, K.H.W., Janssens, L., De Backer, A., Nellist, P.D., Van Aert, S.
Published in Ultramicroscopy (01.08.2019)
Published in Ultramicroscopy (01.08.2019)
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Journal Article
Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy
Martinez, G.T., van den Bos, K.H.W., Alania, M., Nellist, P.D., Van Aert, S.
Published in Ultramicroscopy (01.04.2018)
Published in Ultramicroscopy (01.04.2018)
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Journal Article
Locating light and heavy atomic column positions with picometer precision using ISTEM
van den Bos, K.H.W., Krause, F.F., Béché, A., Verbeeck, J., Rosenauer, A., Van Aert, S.
Published in Ultramicroscopy (01.01.2017)
Published in Ultramicroscopy (01.01.2017)
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Journal Article