Emissivity of freestanding membranes with thin metal coatings
van Zwol, P. J., Vles, D. F., Voorthuijzen, W. P., Péter, M., Vermeulen, H., van der Zande, W. J., Sturm, J. M., van de Kruijs, R. W. E., Bijkerk, F.
Published in Journal of applied physics (07.12.2015)
Published in Journal of applied physics (07.12.2015)
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Journal Article
Grazing‐incidence small‐angle X‐ray scattering study of correlated lateral density fluctuations in W/Si multilayers
Nikolaev, K. V., Yakunin, S. N., Makhotkin, I. A., Rie, J. de la, Medvedev, R. V., Rogachev, A. V., Trunckin, I. N., Vasiliev, A. L., Hendrikx, C. P., Gateshki, M., Kruijs, R. W. E. van de, Bijkerk, F.
Published in Acta crystallographica. Section A, Foundations and advances (01.03.2019)
Published in Acta crystallographica. Section A, Foundations and advances (01.03.2019)
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Journal Article
Specular reflection intensity modulated by grazing‐incidence diffraction in a wide angular range
Nikolaev, K. V., Makhotkin, I. A., Yakunin, S. N., Kruijs, R. W. E. van de, Chuev, M. A., Bijkerk, F.
Published in Acta crystallographica. Section A, Foundations and advances (01.09.2018)
Published in Acta crystallographica. Section A, Foundations and advances (01.09.2018)
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Journal Article
Electronegativity-dependent tin etching from thin films
Pachecka, M., Sturm, J. M., van de Kruijs, R. W. E., Lee, C. J., Bijkerk, F.
Published in AIP advances (01.07.2016)
Published in AIP advances (01.07.2016)
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Journal Article
Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structures
Yakunin, S N, Makhotkin, I A, Nikolaev, K V, van de Kruijs, R W E, Chuev, M A, Bijkerk, F
Published in Optics express (25.08.2014)
Published in Optics express (25.08.2014)
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Journal Article
A semi‐analytical approach for the characterization of ordered 3D nanostructures using grazing‐incidence X‐ray fluorescence
Nikolaev, K. V., Soltwisch, V., Hönicke, P., Scholze, F., de la Rie, J., Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., Bijkerk, F.
Published in Journal of synchrotron radiation (01.03.2020)
Published in Journal of synchrotron radiation (01.03.2020)
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Journal Article
Spectral-purity-enhancing layer for multilayer mirrors
van Herpen, M M J W, van de Kruijs, R W E, Klunder, D J W, Louis, E, Yakshin, A E, van der Westen, S Alonso, Bijkerk, F, Banine, V
Published in Optics letters (15.03.2008)
Published in Optics letters (15.03.2008)
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Journal Article
Self-healing in B12P2 through Mediated Defect Recombination
Huber, S. P, Gullikson, E, Frye, C. D, Edgar, J. H, van de Kruijs, R. W. E, Bijkerk, F, Prendergast, D
Published in Chemistry of materials (22.11.2016)
Published in Chemistry of materials (22.11.2016)
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Journal Article
Determination of oxygen diffusion kinetics during thin film ruthenium oxidation
Coloma Ribera, R., van de Kruijs, R. W. E., Yakshin, A. E., Bijkerk, F.
Published in Journal of applied physics (07.08.2015)
Published in Journal of applied physics (07.08.2015)
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Journal Article
Model independent x-ray standing wave analysis of periodic multilayer structures
Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., Chuev, M. A., Pashaev, E. M., Zoethout, E., Louis, E., Seregin, S. Yu, Subbotin, I. A., Novikov, D. V., Bijkerk, F., Kovalchuk, M. V.
Published in Journal of applied physics (07.04.2014)
Published in Journal of applied physics (07.04.2014)
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Journal Article
Structure of high-reflectance La/B-based multilayer mirrors with partial La nitridation
Kuznetsov, D. S., Yakshin, A. E., Sturm, J. M., van de Kruijs, R. W. E., Bijkerk, F.
Published in AIP advances (01.11.2016)
Published in AIP advances (01.11.2016)
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Journal Article
Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements
Loch, R A, Dubrouil, A, Sobierajski, R, Descamps, D, Fabre, B, Lidon, P, van de Kruijs, R W E, Boekhout, F, Gullikson, E, Gaudin, J, Louis, E, Bijkerk, F, Mével, E, Petit, S, Constant, E, Mairesse, Y
Published in Optics letters (01.09.2011)
Published in Optics letters (01.09.2011)
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Journal Article
High-reflectance La/B-based multilayer mirror for 6.x nm wavelength
Kuznetsov, D S, Yakshin, A E, Sturm, J M, van de Kruijs, R W E, Louis, E, Bijkerk, F
Published in Optics letters (15.08.2015)
Published in Optics letters (15.08.2015)
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Journal Article
In-situ studies of silicide formation during growth of molybdenum-silicon interfaces
Reinink, J., Zameshin, A., van de Kruijs, R. W. E., Bijkerk, F.
Published in Journal of applied physics (07.10.2019)
Published in Journal of applied physics (07.10.2019)
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Journal Article
Nano-size crystallites in Mo/Si multilayer optics
van de Kruijs, R.W.E., Zoethout, E., Yakshin, A.E., Nedelcu, I., Louis, E., Enkisch, H., Sipos, G., Müllender, S., Bijkerk, F.
Published in Thin solid films (25.10.2006)
Published in Thin solid films (25.10.2006)
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Journal Article
Conference Proceeding
Interface roughness in Mo/Si multilayers
Nedelcu, I., van de Kruijs, R.W.E., Yakshin, A.E., Tichelaar, F., Zoethout, E., Louis, E., Enkisch, H., Muellender, S., Bijkerk, F.
Published in Thin solid films (25.10.2006)
Published in Thin solid films (25.10.2006)
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Journal Article
Conference Proceeding
Self-contained in-vacuum in situ thin film stress measurement tool
Reinink, J., van de Kruijs, R. W. E., Bijkerk, F.
Published in Review of scientific instruments (01.05.2018)
Published in Review of scientific instruments (01.05.2018)
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Journal Article
Hydrogenation dynamics of Ru capped Y thin films
Soroka, O., Sturm, J. M., van de Kruijs, R. W. E., Makhotkin, I. A., Nikolaev, K., Yakunin, S. N., Lee, C. J., Bijkerk, F.
Published in Journal of applied physics (14.10.2019)
Published in Journal of applied physics (14.10.2019)
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