The relationship between microsystem technology and metrology
Wolffenbuttel, R.F., van Mullem, C.J.
Published in IEEE transactions on instrumentation and measurement (01.12.2001)
Published in IEEE transactions on instrumentation and measurement (01.12.2001)
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Journal Article
Bulk micromachined electrostatic RMS-to-DC converter
de Graaf, G., Bartek, M., Xiao, Z., van Mullem, C.J., Wolffenbuttel, R.F.
Published in IEEE transactions on instrumentation and measurement (01.12.2001)
Published in IEEE transactions on instrumentation and measurement (01.12.2001)
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Journal Article
Guest editorial
Wolffenbuttel, R.F., Van Mullem, C.J.
Published in IEEE transactions on instrumentation and measurement (01.12.2001)
Published in IEEE transactions on instrumentation and measurement (01.12.2001)
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Journal Article
Guest editorial
Wolffenbuttel, R.F., Van Mullem, C.J.
Published in IEEE transactions on instrumentation and measurement (01.12.2001)
Published in IEEE transactions on instrumentation and measurement (01.12.2001)
Get full text
Journal Article
Guest editorial
Wolffenbuttel, R.F, Van Mullem, C.J
Published in IEEE transactions on instrumentation and measurement (01.11.2001)
Published in IEEE transactions on instrumentation and measurement (01.11.2001)
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Journal Article
Microtechnology and microsystems in measurement applications
Wolffenbuffel, R.F., van Mullem, C.J.
Published in IEEE instrumentation & measurement magazine (01.09.2001)
Published in IEEE instrumentation & measurement magazine (01.09.2001)
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Magazine Article
Improvements in AC-DC voltage transfer at CENAM
Campos, S., Klonz, M., Van Mullem, C.J.
Published in Conference Digest Conference on Precision Electromagnetic Measurements (2002)
Published in Conference Digest Conference on Precision Electromagnetic Measurements (2002)
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Conference Proceeding
Comparison of high frequency AC-DC voltage transfer standards at NRC, VSL, PTB and NIST
Filipski, P.S., Van Mullem, C.J., Janik, D., Klonz, M., Kinard, J.R., Lipe, T., Waltrip, B.
Published in Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031) (2000)
Published in Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031) (2000)
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Conference Proceeding