Fast electromigration wafer mapping for wafer fab process monitoring and improvement
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Conference Proceeding
Negative-bias temperature instability cure by process optimization
Scarpa, A., Ward, D., Dubois, J., van Marwijk, L., Gausepohl, S., Campos, R., Kwang Ye Sim, Cacciato, A., Kho, R., Bolt, M.
Published in IEEE transactions on electron devices (01.06.2006)
Published in IEEE transactions on electron devices (01.06.2006)
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The effect of fluorine implant on NBTI behaviour in BCD-processes
Olthof, E., Combrie, M., van Marwijk, L., Claes, J., Dubois, J., Thillaigovindan, J., Jianhua Sun, Ng, W.
Published in 2011 IEEE International Integrated Reliability Workshop Final Report (01.10.2011)
Published in 2011 IEEE International Integrated Reliability Workshop Final Report (01.10.2011)
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Conference Proceeding
Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes: Fast wafer level reliability: methods and experiences
TAO, Guoqiao, SCARPA, Andrea, VAN MARWIJK, Leo, VAN DIJK, Kitty, KUPER, Fred
Published in Microelectronics and reliability (2004)
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Published in Microelectronics and reliability (2004)
Journal Article
Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes
Tao, Guoqiao, Scarpa, Andrea, van Marwijk, Leo, van Dijk, Kitty, Kuper, Fred
Published in Microelectronics and reliability (01.08.2004)
Published in Microelectronics and reliability (01.08.2004)
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Journal Article
Fast wafer level monitoring of stress induced leakage current in deep sub-micron embedded non-volatile memory processes
Guoqiao Tao, Scarpa, A., Valk, H., van Marwijk, L., van Dijk, K., Kuper, F.
Published in IEEE International Integrated Reliability Workshop Final Report, 2002 (2002)
Published in IEEE International Integrated Reliability Workshop Final Report, 2002 (2002)
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Conference Proceeding