Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes: Fast wafer level reliability: methods and experiences
TAO, Guoqiao, SCARPA, Andrea, VAN MARWIJK, Leo, VAN DIJK, Kitty, KUPER, Fred
Published in Microelectronics and reliability (2004)
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Published in Microelectronics and reliability (2004)
Journal Article
Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes
Tao, Guoqiao, Scarpa, Andrea, van Marwijk, Leo, van Dijk, Kitty, Kuper, Fred
Published in Microelectronics and reliability (01.08.2004)
Published in Microelectronics and reliability (01.08.2004)
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Journal Article
Junction Optimization for Embedded 40nm FN/FN Flash Memory
Baiano, Alessandro, van Duuren, Michiel, van der Vegt, Erik, Schippers, Bob, Beurze, Robert, Tajari Mofrad, Daniel, van Zwol, Hans, Yu Chen, Chiang, Jed, Lokker, Han, van Dijk, Kitty, Verbree, Jouke, Yi Ning Chen, Garbe, Jochen, Verhaar, Rob, Dormans, Do
Published in 2015 IEEE International Memory Workshop (IMW) (01.05.2015)
Published in 2015 IEEE International Memory Workshop (IMW) (01.05.2015)
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Conference Proceeding
SEMICONDUCTOR DEVICE TEST METHOD
HENDRIKS, ANTONIUS, M., P., J, VAN DIJK, KITTY, LEMMEN, GERARD, DINGEMANSE, JOHANNES, D, THOONEN, HERMANUS, H., W
Year of Publication 18.12.2008
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Year of Publication 18.12.2008
Patent
Fast wafer level monitoring of stress induced leakage current in deep sub-micron embedded non-volatile memory processes
Guoqiao Tao, Scarpa, A., Valk, H., van Marwijk, L., van Dijk, K., Kuper, F.
Published in IEEE International Integrated Reliability Workshop Final Report, 2002 (2002)
Published in IEEE International Integrated Reliability Workshop Final Report, 2002 (2002)
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Conference Proceeding