A new method to calculate leakage current and its applications for sub-45nm MOSFETs
Lujan, G.S., Magnus, W., Soree, B., Pourghaderi, M.A., Veloso, A., van Da, M.J.H., Lauwers, A., Kubicek, S., De Gendt, S., Heyns, M., De Meyer, K.
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)
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