by Mani, S.S., Fleming, J.G., Walraven, J.A., Sniegowski, J.J., se Beer, M.P., Irwin, L.W., Tanner, D.M., LaVan, D.A., Dugger, M.T., Jakubczak, J., Miller, W.M.
Published in 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) (2000)