by Xiaobing Shi, Nicolici, Nicola
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2016)

by Yamaguchi, Takahiro J., Abraham, Jacob A., Roberts, Gordon W., Natarajan, Suriyaprakash, Ciplickas, Dennis
Published in 2013 IEEE 31st VLSI Test Symposium (VTS) (01.04.2013)

by Li, Min, Davoodi, Azadeh, Xie, Lin
Published in Proceedings of the Conference on Design, Automation and Test in Europe (12.03.2012)

by Min Li, Davoodi, Azadeh, Lin Xie
Published in 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2012)

by Rayas-Sanchez, Jose E., Bandler, John W.
Published in IEEE MTT-S International Microwave Symposium digest (19.06.2022)

by Sauer, M., Czutro, A., Becker, B., Polian, I.
Published in 2012 17th IEEE European Test Symposium (ETS) (01.05.2012)

Year of Publication 10.05.2016

by PANDA SUBRAT K, KURUCHETI GUNARANJAN, KOLASSERY VYSAKH
Year of Publication 10.05.2016

by PANDA SUBRAT K, KURUCHETI GUNARANJAN, KOLASSERY VYSAKH
Year of Publication 02.07.2015

Year of Publication 27.12.2013

by Wei Yao, Yiyu Shi, Lei He, Pamarti, S.
Published in 2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers (01.11.2009)

by Xiaobing Shi, Nicolici, Nicola
Published in Proceedings / IEEE International On-Line Testing Symposium (01.07.2017)

by Chen, Wen, Bhadra, Jayanta, Wang, Li-C.
Published in Fundamentals of IP and SoC Security (2017)

Year of Publication 22.01.2013

by SHUREK GIL, ADIR ALLON
Year of Publication 22.01.2013

by Krishna, B. A., Michelson, Jonathan, Singhal, Vigyan, Jain, Alok
Published in Hardware and Software: Verification and Testing (2012)

by SHUREK GIL, ADIR ALLON
Year of Publication 25.08.2011

by GOLUBEV MAXIM, KLINGER ANDREY, ADIR ALLON, NAHIR AMIR
Year of Publication 17.07.2012

by Adir, Allon, Golubev, Maxim, Klinger, Andrey, Nahir, Amir
Year of Publication 17.07.2012

by GOLUBEV MAXIM, KLINGER ANDREY, ADIR ALLON, NAHIR AMIR
Year of Publication 05.05.2011