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The issues on the power consumption of trigate FinFET: The design and manufacturing guidelines

by Chung, Steve S., Hsieh, E. R.
Published in Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits (01.07.2017)

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Conference Proceeding

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Geometric variation: A novel approach to examine the surface roughness and the line roughness effects in trigate FinFETs

by Hsieh, E. R., Fan, Y. C., Liu, C. H., Chung, Steve S., Huang, R. M., Tsai, C. T., Yew, T. R.
Published in 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) (01.02.2017)

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Conference Proceeding

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Avoid change of current variation to connect frequent device of adjusting

by HONG SIYUAN
Year of Publication 05.12.2017

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Patent

The issues on the power consumption of trigate FinFET: The design and manufacturing guidelines

Geometric variation: A novel approach to examine the surface roughness and the line roughness effects in trigate FinFETs

Avoid change of current variation to connect frequent device of adjusting

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