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Giovannetti, Vittorio, Lloyd, Seth, Maccone, Lorenzo
Published in Physical review letters (13.01.2006)
Published in Physical review letters (13.01.2006)
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Koczor, Bálint, Endo, Suguru, Jones, Tyson, Matsuzaki, Yuichiro, Benjamin, Simon C
Published in New journal of physics (01.08.2020)
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Multi-petahertz electronic metrology
Garg, M, Zhan, M, Luu, T T, Lakhotia, H, Klostermann, T, Guggenmos, A, Goulielmakis, E
Published in Nature (London) (20.10.2016)
Published in Nature (London) (20.10.2016)
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Fang, Liang, Wan, Zhenyu, Forbes, Andrew, Wang, Jian
Published in Nature communications (07.07.2021)
Published in Nature communications (07.07.2021)
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Frequency Ratio of Al⁺ and Hg⁺ Single-Ion Optical Clocks; Metrology at the 17th Decimal Place
Rosenband, T, Hume, D.B, Schmidt, P.O, Chou, C.W, Brusch, A, Lorini, L, Oskay, W.H, Drullinger, R.E, Fortier, T.M, Stalnaker, J.E, Diddams, S.A, Swann, W.C, Newbury, N.R, Itano, W.M, Wineland, D.J, Bergquist, J.C
Published in Science (American Association for the Advancement of Science) (28.03.2008)
Published in Science (American Association for the Advancement of Science) (28.03.2008)
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Attosecond metrology
Krausz, F, Hentschel, M, Kienberger, R, Spielmann, Ch, Reider, G. A, Milosevic, N, Brabec, T, Corkum, P, Heinzmann, U, Drescher, M
Published in Nature (London) (29.11.2001)
Published in Nature (London) (29.11.2001)
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Multi-parameter quantum metrology
Szczykulska, Magdalena, Baumgratz, Tillmann, Datta, Animesh
Published in Advances in physics: X (03.07.2016)
Published in Advances in physics: X (03.07.2016)
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Quantum error correction for metrology
Kessler, E M, Lovchinsky, I, Sushkov, A O, Lukin, M D
Published in Physical review letters (18.04.2014)
Published in Physical review letters (18.04.2014)
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Optimal metrology with programmable quantum sensors
Marciniak, Christian D, Feldker, Thomas, Pogorelov, Ivan, Kaubruegger, Raphael, Vasilyev, Denis V, van Bijnen, Rick, Schindler, Philipp, Zoller, Peter, Blatt, Rainer, Monz, Thomas
Published in Nature (London) (24.03.2022)
Published in Nature (London) (24.03.2022)
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Deep learning in optical metrology: a review
Zuo, Chao, Qian, Jiaming, Feng, Shijie, Yin, Wei, Li, Yixuan, Fan, Pengfei, Han, Jing, Qian, Kemao, Chen, Qian
Published in Light, science & applications (23.02.2022)
Published in Light, science & applications (23.02.2022)
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Quantum-dense metrology
Steinlechner, Sebastian, Bauchrowitz, Jöran, Meinders, Melanie, Müller-Ebhardt, Helge, Danzmann, Karsten, Schnabel, Roman
Published in Nature photonics (01.08.2013)
Published in Nature photonics (01.08.2013)
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Evaluating the Holevo Cramér-Rao Bound for Multiparameter Quantum Metrology
Albarelli, Francesco, Friel, Jamie F, Datta, Animesh
Published in Physical review letters (15.11.2019)
Published in Physical review letters (15.11.2019)
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Geometrical metrology for metal additive manufacturing
Leach, R.K., Bourell, D., Carmignato, S., Donmez, A., Senin, N., Dewulf, W.
Published in CIRP annals (2019)
Published in CIRP annals (2019)
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Improving metrology with quantum scrambling
Li, Zeyang, Colombo, Simone, Shu, Chi, Velez, Gustavo, Pilatowsky-Cameo, Saúl, Schmied, Roman, Choi, Soonwon, Lukin, Mikhail, Pedrozo-Peñafiel, Edwin, Vuletić, Vladan
Published in Science (American Association for the Advancement of Science) (30.06.2023)
Published in Science (American Association for the Advancement of Science) (30.06.2023)
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