Multisensor data fusion in dimensional metrology
Weckenmann, A., Jiang, X., Sommer, K.-D., Neuschaefer-Rube, U., Seewig, J., Shaw, L., Estler, T.
Published in CIRP annals (2009)
Published in CIRP annals (2009)
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Conference Proceeding
Hybrid Metrology for Nanostructured Optical Metasurfaces
Murataj, Irdi, Angelini, Angelo, Cara, Eleonora, Porro, Samuele, Beckhoff, Burkhard, Kayser, Yves, Hönicke, Philipp, Ciesielski, Richard, Gollwitzer, Christian, Soltwisch, Victor, Perez-Murano, Francesc, Fernandez-Regulez, Marta, Carignano, Stefano, Boarino, Luca, Castellino, Micaela, Ferrarese Lupi, Federico
Published in ACS applied materials & interfaces (20.12.2023)
Published in ACS applied materials & interfaces (20.12.2023)
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Power-recycled weak-value-based metrology
Lyons, Kevin, Dressel, Justin, Jordan, Andrew N, Howell, John C, Kwiat, Paul G
Published in Physical review letters (01.05.2015)
Published in Physical review letters (01.05.2015)
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Optimal Strategies of Quantum Metrology with a Strict Hierarchy
Liu, Qiushi, Hu, Zihao, Yuan, Haidong, Yang, Yuxiang
Published in Physical review letters (17.02.2023)
Published in Physical review letters (17.02.2023)
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New European Metrology Network for advanced manufacturing
Przyklenk, Anita, Balsamo, Alessandro, O’Connor, Daniel, Evans, Alexander, Yandayan, Tanfer, Akgöz, Sibel Asli, Flys, Olena, Phillips, Dishi, Zeleny, Vit, Czułek, Dariusz, Meli, Felix, Ragusa, Carlo Stefano, Bosse, Harald
Published in Measurement science & technology (01.11.2021)
Published in Measurement science & technology (01.11.2021)
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Absolute frequency metrology of buffer-gas-cooled molecular spectra at 1 kHz accuracy level
Aiello, Roberto, Di Sarno, Valentina, Delli Santi, Maria Giulia, De Rosa, Maurizio, Ricciardi, Iolanda, De Natale, Paolo, Santamaria, Luigi, Giusfredi, Giovanni, Maddaloni, Pasquale
Published in Nature communications (16.11.2022)
Published in Nature communications (16.11.2022)
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Contextual quantum metrology
Jae, Jeongwoo, Lee, Jiwon, Kim, M. S., Lee, Kwang-Geol, Lee, Jinhyoung
Published in npj quantum information (04.07.2024)
Published in npj quantum information (04.07.2024)
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Shrinking optical metrology
Osborne, Ian S.
Published in Science (American Association for the Advancement of Science) (10.08.2018)
Published in Science (American Association for the Advancement of Science) (10.08.2018)
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The cognitive process in metrology
Mroczka, Janusz
Published in Measurement : journal of the International Measurement Confederation (01.10.2013)
Published in Measurement : journal of the International Measurement Confederation (01.10.2013)
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Multiparameter quantum critical metrology
Di Fresco, Giovanni, Spagnolo, Bernardo, Valenti, Davide, Carollo, Angelo
Published in SciPost physics (01.10.2022)
Published in SciPost physics (01.10.2022)
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Journal Article
Quantum sensing and metrology for fundamental physics with molecules
DeMille, David, Hutzler, Nicholas R., Rey, Ana Maria, Zelevinsky, Tanya
Published in Nature physics (01.05.2024)
Published in Nature physics (01.05.2024)
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Journal Article
New metrology for radon at the environmental level
Röttger, Annette, Röttger, Stefan, Grossi, Claudia, Vargas, Arturo, Curcoll, Roger, Otáhal, Petr, Hernández-Ceballos, Miguel Ángel, Cinelli, Giorgia, Chambers, Scott, Barbosa, Susana Alexandra, Ioan, Mihail-Razvan, Radulescu, Ileana, Kikaj, Dafina, Chung, Edward, Arnold, Tim, Yver-Kwok, Camille, Fuente, Marta, Mertes, Florian, Morosh, Viacheslav
Published in Measurement science & technology (01.12.2021)
Published in Measurement science & technology (01.12.2021)
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