by Zhou, Jingbo, Zhang, Xinmiao
Published in IEEE transactions on information forensics and security (2021)

by Subbiah, Karthik, Chinnathevar, Sujatha
Published in Journal of the Institution of Engineers (India). Series B, Electrical Engineering, Electronics and telecommunication engineering, Computer engineering (01.08.2024)

by Chellam, Manjith Baby Sarojam, Natarajan, Ramasubramanian, Naganathan, Nagi
Published in VLSI design (06.01.2024)

by Alrahis, Lilas, Patnaik, Satwik, Hanif, Muhammad Abdullah, Saleh, Hani, Shafique, Muhammad, Sinanoglu, Ozgur
Published in IEEE transactions on emerging topics in computing (01.07.2022)

by Zhou, Jingbo, Zhang, Xinmiao
Published in IEEE International Symposium on Circuits and Systems proceedings (01.10.2020)

by Zhou, Jingbo, Zhang, Xinmiao
Published in Conference proceedings : Midwest Symposium on Circuits and Systems (09.08.2021)

by Mahfuz, Tanzim, Bhunia, Swarup, Chakraborty, Prabuddha
Published in IEEE transactions on information forensics and security (2025)

by Zhou, Jingbo, Zhang, Xinmiao
Published in arXiv.org (29.03.2021)

by Leonhard, Julian, Limaye, Nimisha, Turk, Shadi, Sayed, Alhassan, Rizo, Alan Rodrigo Diaz, Aboushady, Hassan, Sinanoglu, Ozgur, Stratigopoulos, Haralampos-G.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2022)

by Rahman, Md Moshiur, Almawzan, Rasheed, Dasgupta, Aritra, Paria, Sudipta, Bhunia, Swarup
Published in 2024 IEEE Physical Assurance and Inspection of Electronics (PAINE) (12.11.2024)

by Mahfuz, Tanzim, Bhunia, Swarup, Chakraborty, Prabuddha
Year of Publication 11.11.2024

by Mahfuz, Tanzim, Bhunia, Swarup, Chakraborty, Prabuddha
Published in arXiv.org (11.11.2024)

by Yang Xie, Chongxi Bao, Yuntao Liu, Srivastava, Ankur
Published in Proceedings / International Workshop on Microprocessor Test and Verification (01.12.2016)