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Fitting a model to floating gate prompt charge loss test data for the samsung 8 Gb SLC NAND flash memory
Edmonds, L. D., Irom, F., Allen, G. R.
Published in RADECS : 2016 16th European Conference on Radiation and Its Effects on Components and Systems : September 19-23, 2016, Bremen, Germany (01.09.2016)
Published in RADECS : 2016 16th European Conference on Radiation and Its Effects on Components and Systems : September 19-23, 2016, Bremen, Germany (01.09.2016)
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