Fast and reliable pre-approach for scanning probe microscopes based on tip-sample capacitance
de Voogd, J.M., van Spronsen, M.A., Kalff, F.E., Bryant, B., Ostojić, O., den Haan, A.M.J., Groot, I.M.N., Oosterkamp, T.H., Otte, A.F., Rost, M.J.
Published in Ultramicroscopy (01.10.2017)
Published in Ultramicroscopy (01.10.2017)
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