Estimation of unknown structure parameters from high-resolution (S)TEM images: What are the limits?
den Dekker, A.J., Gonnissen, J., De Backer, A., Sijbers, J., Van Aert, S.
Published in Ultramicroscopy (01.11.2013)
Published in Ultramicroscopy (01.11.2013)
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Journal Article
Estimation of the Noise in Magnitude MR Images
Sijbers, J., den Dekker, A.J., Van Audekerke, J., Verhoye, M., Van Dyck, D.
Published in Magnetic resonance imaging (1998)
Published in Magnetic resonance imaging (1998)
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Journal Article
High-resolution electron microscopy: from imaging toward measuring
Van Aert, S., den Dekker, A.J., van den Bos, A., Van Dyck, D.
Published in IEEE transactions on instrumentation and measurement (01.08.2002)
Published in IEEE transactions on instrumentation and measurement (01.08.2002)
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Journal Article
Atom column detection from simultaneously acquired ABF and ADF STEM images
Fatermans, J., den Dekker, A.J., Müller-Caspary, K., Gauquelin, N., Verbeeck, J., Van Aert, S.
Published in Ultramicroscopy (01.12.2020)
Published in Ultramicroscopy (01.12.2020)
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Journal Article
Optimal Experimental Design for Diffusion Kurtosis Imaging
Poot, D.H.J., den Dekker, A.J., Achten, E., Verhoye, M., Sijbers, J.
Published in IEEE transactions on medical imaging (01.03.2010)
Published in IEEE transactions on medical imaging (01.03.2010)
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Journal Article
Recurrent inference machines as inverse problem solvers for MR relaxometry
Sabidussi, E.R., Klein, S., Caan, M.W.A., Bazrafkan, S., den Dekker, A.J., Sijbers, J., Niessen, W.J., Poot, D.H.J.
Published in Medical image analysis (01.12.2021)
Published in Medical image analysis (01.12.2021)
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Journal Article
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design
Gonnissen, J., De Backer, A., den Dekker, A.J., Sijbers, J., Van Aert, S.
Published in Ultramicroscopy (01.11.2016)
Published in Ultramicroscopy (01.11.2016)
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Journal Article
Atom-counting in High Resolution Electron Microscopy:TEM or STEM – That's the question
Gonnissen, J., De Backer, A., den Dekker, A.J., Sijbers, J., Van Aert, S.
Published in Ultramicroscopy (01.03.2017)
Published in Ultramicroscopy (01.03.2017)
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Journal Article
Delta-MRI: Direct Deformation Estimation from Longitudinally Acquired K-Space Data
Renders, J., Shafieizargar, B., Verhoye, M., De Beenhouwer, J., Den Dekker, A.J., Sijbers, J.
Published in 2023 IEEE 20th International Symposium on Biomedical Imaging (ISBI) (18.04.2023)
Published in 2023 IEEE 20th International Symposium on Biomedical Imaging (ISBI) (18.04.2023)
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Conference Proceeding
Maximum-likelihood estimation of Rician distribution parameters
Sijbers, J., den Dekker, A.J., Scheunders, P., Van Dyck, D.
Published in IEEE transactions on medical imaging (01.06.1998)
Published in IEEE transactions on medical imaging (01.06.1998)
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Journal Article
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?
Van Dyck, D., Van Aert, S., den Dekker, A.J., van den Bos, A.
Published in Ultramicroscopy (01.12.2003)
Published in Ultramicroscopy (01.12.2003)
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Journal Article
High-resolution electron microscopy and electron tomography: resolution versus precision
Van Aert, S., den Dekker, A.J., Van Dyck, D., van den Bos, A.
Published in Journal of structural biology (01.04.2002)
Published in Journal of structural biology (01.04.2002)
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Journal Article
Optimal experimental design of STEM measurement of atom column positions
Van Aert, S., den Dekker, A.J., Van Dyck, D., van den Bos, A.
Published in Ultramicroscopy (01.04.2002)
Published in Ultramicroscopy (01.04.2002)
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Journal Article