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Unraveling the Light‐Induced Degradation Mechanisms of CH3NH3PbI3 Perovskite Films
Nickel, Norbert H., Lang, Felix, Brus, Victor V., Shargaieva, Oleksandra, Rappich, Jörg
Published in Advanced electronic materials (01.12.2017)
Published in Advanced electronic materials (01.12.2017)
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Degradation mechanisms of low-calcium fly ash-based geopolymer mortar in simulated aggressive sewer conditions
Ariyadasa, Piumika W., Manalo, Allan C., Lokuge, Weena, Aravienthan, Vasantha, Gerdes, Andreas, Kaltenbach, Jonas
Published in Cement and concrete research (01.08.2025)
Published in Cement and concrete research (01.08.2025)
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A review of the degradation mechanisms of NCM cathodes and corresponding mitigation strategies
Britala, Liga, Marinaro, Mario, Kucinskis, Gints
Published in Journal of energy storage (01.12.2023)
Published in Journal of energy storage (01.12.2023)
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Lifetime estimation models and degradation mechanisms of elastomeric materials: A critical review
Bensalem, Karim, Eesaee, Mostafa, Hassanipour, Meysam, Elkoun, Said, David, Eric, Agbossou, Kodjo, Nguyen-Tri, Phuong
Published in Polymer degradation and stability (01.02.2024)
Published in Polymer degradation and stability (01.02.2024)
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Step-by-step investigation of degradation mechanisms induced by CMAS attack on YSZ materials for TBC applications
Pujol, Guillaume, Ansart, Florence, Bonino, Jean-Pierre, Malié, André, Hamadi, Sarah
Published in Surface & coatings technology (25.12.2013)
Published in Surface & coatings technology (25.12.2013)
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Heterogeneous Fenton oxidation of paracetamol in aqueous solution using iron slag as a catalyst: Degradation mechanisms and kinetics
Van, Huu Tap, Nguyen, Lan Huong, Hoang, Trung Kien, Nguyen, Thi Tuyet, Tran, Thi Ngoc Ha, Nguyen, Thi Bich Hanh, Vu, Xuan Hoa, Pham, Minh Tan, Tran, Thi Pha, Pham, T.T., Nguyen, Hai Duy, Chao, Huan-Ping, Lin, Chu-Ching, Nguyen, X.C.
Published in Environmental technology & innovation (01.05.2020)
Published in Environmental technology & innovation (01.05.2020)
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P‐120: Accelerated Lifetime Testing and Degradation Mechanisms of a Blue TADF OLED
Sem, Stefano, Jenatsch, Sandra, Züfle, Simon, Gadola, Arno, Hudson, Daniel, Pflumm, Christof, Ruhstaller, Beat
Published in SID International Symposium Digest of technical papers (01.06.2023)
Published in SID International Symposium Digest of technical papers (01.06.2023)
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RON Degradation Mechanisms of ON-Wafer 100-V p-GaN HEMTs Emulating Monolithically Integrated Half-Bridge Circuits
Zagni, Nicolo, Modica, Lorenzo, Cioni, Marcello, Cappellini, Giacomo, Castagna, Maria Eloisa, Giorgino, Giovanni, Iucolano, Ferdinando, Verzellesi, Giovanni, Chini, Alessandro
Published in IEEE Workshop on Wide Bandgap Power Devices and Applications (04.11.2024)
Published in IEEE Workshop on Wide Bandgap Power Devices and Applications (04.11.2024)
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Prediction of the main degradation mechanisms in a hot forging steel die: Optical scanning, simulation, microstructural evolution, and neural network modeling
Emamverdian, Aliakbar, Pruncu, Catalin, Liu, Hongsheng, Rahimzadeh, Atabak, Lamberti, Luciano
Published in Journal of materials research and technology (01.07.2025)
Published in Journal of materials research and technology (01.07.2025)
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Reassessment of degradation mechanisms in anodic tantalum oxide capacitors under high electric fields
Su, Xin, Viste, Mark, Hossick-Schott, Joachim, Yang, Lei, Sheldon, Brian W.
Published in Journal of materials science (01.01.2015)
Published in Journal of materials science (01.01.2015)
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Unraveling the Light‐Induced Degradation Mechanisms of CH 3 NH 3 PbI 3 Perovskite Films
Nickel, Norbert H., Lang, Felix, Brus, Victor V., Shargaieva, Oleksandra, Rappich, Jörg
Published in Advanced electronic materials (01.12.2017)
Published in Advanced electronic materials (01.12.2017)
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Gain degradation mechanisms in wafer fused AlGaAs∕GaAs∕GaN heterojunction bipolar transistors
Lian, Chuanxin, Xing, Huili Grace, Wang, Chad S., Brown, David, McCarthy, Lee
Published in Applied physics letters (06.08.2007)
Published in Applied physics letters (06.08.2007)
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Degradation Mechanisms in CMOS Power Amplifiers Subject to Radio-Frequency Stress and Comparison to the DC Case
Presti, C.D., Carrara, F., Scuderi, A., Lombardo, S., Palmisano, G.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Study on the durability of compression behavior for glass fiber‐reinforced polypropylene thermoplastic composite bars in various aging environments
Zhou, Ping, Dong, Shaoce, Li, Chenggao, Kong, Deao, Bai, Yanbo, Xian, Guijun, Yue, Qingrui
Published in Polymer composites (20.06.2024)
Published in Polymer composites (20.06.2024)
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