LDMOST gate oxide breakdown prediction under realistic RF power application conditions
Guoqiao Tao, van Nederveen, Sjoerd, de Vaan, Mario
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)
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Conference Proceeding
FEM modelling of porosity in Ag sintering die attach for RF power applications
Huang, Jianlin, Scholten, Huib, de Bruijn, Frank, Xiao, An, de Vaan, Mario
Published in 2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (01.04.2018)
Published in 2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (01.04.2018)
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Conference Proceeding