Trap-state mapping to model GaN transistors dynamic performance
Modolo, Nicola, De Santi, Carlo, Minetto, Andrea, Sayadi, Luca, Prechtl, Gerhard, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Scientific reports (02.02.2022)
Published in Scientific reports (02.02.2022)
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Journal Article
Degradation processes of 280 nm high power DUV LEDs: impact on parasitic luminescence
Trivellin, Nicola, Monti, Desiree, Piva, Francesco, Buffolo, Matteo, De Santi, Carlo, Zanoni, Enrico, Meneghesso, Gaudenzio, Meneghini, Matteo
Published in Japanese Journal of Applied Physics (01.06.2019)
Published in Japanese Journal of Applied Physics (01.06.2019)
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Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment
Tajalli, Alaleh, Borga, Matteo, Meneghini, Matteo, De Santi, Carlo, Benazzi, Davide, Besendörfer, Sven, Püsche, Roland, Derluyn, Joff, Degroote, Stefan, Germain, Marianne, Kabouche, Riad, Abid, Idriss, Meissner, Elke, Zanoni, Enrico, Medjdoub, Farid, Meneghesso, Gaudenzio
Published in Micromachines (Basel) (17.01.2020)
Published in Micromachines (Basel) (17.01.2020)
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The 2020 UV emitter roadmap
Amano, Hiroshi, Collazo, Ramón, Santi, Carlo De, Einfeldt, Sven, Funato, Mitsuru, Glaab, Johannes, Hagedorn, Sylvia, Hirano, Akira, Hirayama, Hideki, Ishii, Ryota, Kashima, Yukio, Kawakami, Yoichi, Kirste, Ronny, Kneissl, Michael, Martin, Robert, Mehnke, Frank, Meneghini, Matteo, Ougazzaden, Abdallah, Parbrook, Peter J, Rajan, Siddharth, Reddy, Pramod, Römer, Friedhard, Ruschel, Jan, Sarkar, Biplab, Scholz, Ferdinand, Schowalter, Leo J, Shields, Philip, Sitar, Zlatko, Sulmoni, Luca, Wang, Tao, Wernicke, Tim, Weyers, Markus, Witzigmann, Bernd, Wu, Yuh-Renn, Wunderer, Thomas, Zhang, Yuewei
Published in Journal of physics. D, Applied physics (09.12.2020)
Published in Journal of physics. D, Applied physics (09.12.2020)
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Journal Article
Deep-Level Characterization in GaN HEMTs-Part I: Advantages and Limitations of Drain Current Transient Measurements
Bisi, Davide, Meneghini, Matteo, de Santi, Carlo, Chini, Alessandro, Dammann, Michael, Bruckner, Peter, Mikulla, Michael, Meneghesso, Gaudenzio, Zanoni, Enrico
Published in IEEE transactions on electron devices (01.10.2013)
Published in IEEE transactions on electron devices (01.10.2013)
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Journal Article
Advanced defect spectroscopy in wide-bandgap semiconductors: review and recent results
Fregolent, Manuel, Piva, Francesco, Buffolo, Matteo, Santi, Carlo De, Cester, Andrea, Higashiwaki, Masataka, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Journal of physics. D, Applied physics (01.11.2024)
Published in Journal of physics. D, Applied physics (01.11.2024)
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Journal Article
Fast Characterization of Power LEDs: Circuit Design and Experimental Results
Roccato, Nicola, Piva, Francesco, Buffolo, Matteo, Trivellin, Nicola, De Santi, Carlo, Narduzzi, Claudio, Fraccaroli, Riccardo, Caria, Alessandro, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in IEEE transactions on electron devices (01.06.2024)
Published in IEEE transactions on electron devices (01.06.2024)
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Journal Article
On the CET-Map Ill-Posed Inversion Problem: Theory and Application to GaN HEMTs
Modolo, Nicola, De Santi, Carlo, Baratella, Giulio, Minetto, Andrea, Sayadi, Luca, Sicre, Sebastien, Prechtl, Gerhard, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in IEEE transactions on electron devices (01.03.2024)
Published in IEEE transactions on electron devices (01.03.2024)
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Journal Article
Optically Induced Degradation Due to Thermally Activated Diffusion in GaN-Based InGaN/GaN MQW Solar Cells
Nicoletto, Marco, Caria, Alessandro, Santi, Carlo De, Buffolo, Matteo, Huang, Xuanqui, Fu, Houqiang, Chen, Hong, Zhao, Yuji, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in IEEE transactions on electron devices (01.03.2023)
Published in IEEE transactions on electron devices (01.03.2023)
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Journal Article
Degradation of GaN-Based Multiple Quantum Wells Solar Cells Under Forward Bias: Investigation Based on Optical Measurements and Steady-State Photocapacitance
Caria, Alessandro, Santi, Carlo De, Buffolo, Matteo, Nicoletto, Marco, Huang, Xuanqi, Fu, Houqiang, Chen, Hong, Zhao, Yuji, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in IEEE transactions on electron devices (01.07.2023)
Published in IEEE transactions on electron devices (01.07.2023)
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Journal Article
Gate leakage modeling in lateral β-Ga2O3 MOSFETs with Al2O3 gate dielectric
Fregolent, Manuel, Brusaterra, Enrico, De Santi, Carlo, Tetzner, Kornelius, Würfl, Joachim, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Applied physics letters (04.09.2023)
Published in Applied physics letters (04.09.2023)
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Journal Article
Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics
Zenari, Michele, Buffolo, Matteo, Santi, Carlo De, Goyvaerts, Jeroen, Grabowski, Alexander, Gustavsson, Johan, Baets, Roel, Larsson, Anders, Roelkens, Gunther, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in IEEE transactions on electron devices (01.02.2024)
Published in IEEE transactions on electron devices (01.02.2024)
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Journal Article
V-Pits and Trench-Like Defects in High Periodicity MQWs GaN-Based Solar Cells: Extensive Electro-Optical Analysis
Nicoletto, Marco, Caria, Alessandro, Rampazzo, Fabiana, De Santi, Carlo, Buffolo, Matteo, Rossi, Francesca, Huang, Xuanqui, Fu, Houqiang, Chen, Hong, Zhao, Yuji, Gasparotto, Andrea, Becht, Conny, Schwarz, Ulrich T., Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in IEEE transactions on electron devices (01.03.2024)
Published in IEEE transactions on electron devices (01.03.2024)
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Journal Article
Modeling the electrical degradation of AlGaN-based UV-C LEDs by combined deep-level optical spectroscopy and TCAD simulations
Roccato, Nicola, Piva, Francesco, De Santi, Carlo, Buffolo, Matteo, Fregolent, Manuel, Pilati, Marco, Susilo, Norman, Vidal, Daniel Hauer, Muhin, Anton, Sulmoni, Luca, Wernicke, Tim, Kneissl, Michael, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Applied physics letters (17.04.2023)
Published in Applied physics letters (17.04.2023)
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Journal Article
Modeling the electrical characteristics of InGaN/GaN LED structures based on experimentally-measured defect characteristics
Roccato, Nicola, Piva, Francesco, Santi, Carlo De, Brescancin, Riccardo, Mukherjee, Kalparupa, Buffolo, Matteo, Haller, Camille, Carlin, Jean-François, Grandjean, Nicolas, Vallone, Marco, Tibaldi, Alberto, Bertazzi, Francesco, Goano, Michele, Verzellesi, Giovanni, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Journal of physics. D, Applied physics (21.10.2021)
Published in Journal of physics. D, Applied physics (21.10.2021)
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Journal Article
Origin of the Diffusion-Related Optical Degradation of 1.3 μm Inas QD-LDs Epitaxially Grown on Silicon Substrate
Buffolo, Matteo, Lain, Federico, Zenari, M., Santi, Carlo De, Norman, Justin, Bowers, John E., Herrick, Robert W., Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in IEEE journal of selected topics in quantum electronics (01.01.2022)
Published in IEEE journal of selected topics in quantum electronics (01.01.2022)
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Journal Article
Defect-Related Degradation of AlGaN-Based UV-B LEDs
Monti, Desiree, Meneghini, Matteo, De Santi, Carlo, Meneghesso, Gaudenzio, Zanoni, Enrico, Glaab, Johannes, Rass, Jens, Einfeldt, Sven, Mehnke, Frank, Enslin, Johannes, Wernicke, Tim, Kneissl, Michael
Published in IEEE transactions on electron devices (01.01.2017)
Published in IEEE transactions on electron devices (01.01.2017)
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Journal Article
Laser-Based Lighting: Experimental Analysis and Perspectives
Trivellin, Nicola, Yushchenko, Maksym, Buffolo, Matteo, De Santi, Carlo, Meneghini, Matteo, Meneghesso, Gaudenzio, Zanoni, Enrico
Published in Materials (11.10.2017)
Published in Materials (11.10.2017)
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Journal Article
Deep levels and carrier capture kinetics in n-GaAsBi alloys investigated by deep level transient spectroscopy
Fregolent, Manuel, Buffolo, Matteo, De Santi, Carlo, Hasegawa, Sho, Matsumura, Junta, Nishinaka, Hiroyuki, Yoshimoto, Masahiro, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Journal of physics. D, Applied physics (26.08.2021)
Published in Journal of physics. D, Applied physics (26.08.2021)
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Journal Article