by Qiu, Y., Bender, H., Richard, O., Kim, M.-S., Van Besien, E., Vos, I., de Potter de ten Broeck, M., Mocuta, D., Vandervorst, W.
Published in Scientific reports (04.08.2015)

by Hellings, G., Scholz, M., Detalle, M., Velenis, D., de Potter de ten Broeck, M., Roda Neve, C., Li, Y., Van Huylenbroek, S., Chen, S.-H, Marinissen, E.-J, La Manna, A., Van der Plas, G., Linten, D., Beyne, E., Thean, A.
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)

by Griffoni, A., Silvestri, M., Gerardin, S., Meneghesso, G., Paccagnella, A., Kaczer, B., de Potter de ten Broeck, M., Verbeeck, R., Nackaerts, A.
Published in IEEE transactions on nuclear science (01.08.2009)

by Detalle, Mikael, Rakowski, Michal, Potoms, Goedele, Mercha, Abdelkarim, De Potter de ten Broeck, Muriel, Phommahaxay, Alain, Sabuncuoglu Tezcan, Deniz, Soussan, Philippe
Published in ECS transactions (01.01.2010)

by Van der Plas, G, Limaye, P, Loi, I, Mercha, A, Oprins, H, Torregiani, C, Thijs, S, Linten, D, Stucchi, M, Katti, G, Velenis, D, Cherman, V, Vandevelde, B, Simons, V, De Wolf, I, Labie, R, Perry, D, Bronckers, S, Minas, N, Cupac, M, Ruythooren, W, Van Olmen, J, Phommahaxay, A, de Potter de ten Broeck, M, Opdebeeck, A, Rakowski, M, De Wachter, B, Dehan, M, Nelis, M, Agarwal, R, Pullini, A, Angiolini, F, Benini, L, Dehaene, W, Travaly, Y, Beyne, E, Marchal, P
Published in IEEE journal of solid-state circuits (01.01.2011)

by Hellings, G., Scholz, M., Detalle, M., Velenis, D., de Potter de ten Broeck, M., Neve, C. Roda, Li, Y., Van Huylenbroek, S., Chen, S.-H, Marinissen, E.-J, La Manna, A., Van der Plas, G., Linten, D., Beyne, E., Thean, A.
Published in 2015 Symposium on VLSI Circuits (VLSI Circuits) (01.06.2015)

by Sleeckx, E., Schaekers, M., Shi, X., Kunnen, E., Degroote, B., Jurczak, M., de Potter de ten Broeck, M., Augendre, E.
Published in Microelectronics and reliability (01.05.2005)

by Van der Plas, G., Limaye, P., Mercha, A., Oprins, H., Torregiani, C., Thijs, S., Linten, D., Stucchi, M., Guruprasad, K., Velenis, D., Shinichi, D., Cherman, V., Vandevelde, B., Simons, V., De Wolf, I., Labie, R., Perry, D., Bronckers, S., Minas, N., Cupac, M., Ruythooren, W., Van Olmen, J., Phommahaxay, A., de Potter de ten Broeck, M., Opdebeeck, A., Rakowski, M., De Wachter, B., Dehan, M., Nelis, M., Agarwal, R., Dehaene, W., Travaly, Y., Marchal, P., Beyne, E.
Published in 2010 IEEE International Solid-State Circuits Conference - (ISSCC) (01.02.2010)

by Chiarella, T., Ramos, J., Nackaerts, A., Demuynck, S., Verhaegen, S., Verbeeck, R., de Potter de ten Broeck, M., Kerner, C., Hoffmann, T., Van Hove, M., Debusschere, I., Biesemans, S.
Published in 2006 IEEE International Conference on Microelectronic Test Structures (2006)

by Van Olmen, J., Mercha, A., Katti, G., Huyghebaert, C., Van Aelst, J., Seppala, E., Zhao Chao, Armini, S., Vaes, J., Teixeira, R.C., Van Cauwenberghe, M., Verdonck, P., Verhemeldonck, K., Jourdain, A., Ruythooren, W., de Potter de ten Broeck, M., Opdebeeck, A., Chiarella, T., Parvais, B., Debusschere, I., Hoffmann, T.Y., De Wachter, B., Dehaene, W., Stucchi, M., Rakowski, M., Soussan, P., Cartuyvels, R., Beyne, E., Biesemans, S., Swinnen, B.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)

by Augendre, E., Rooyackers, R., de Potter de ten Broeck, M., Kunnen, E., Beckx, S., Mannaert, G., Vrancken, C., Vassilev, V., Chiarella, T., Jurczak, M., Debusschere, I.
Published in ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003 (2003)

by Griffoni, A, Silvestri, M, Gerardin, S, Meneghesso, G, Paccagnella, A, Kaczer, B, de Potter de ten Broeck, M, Verbeeck, R, Nackaerts, A
Published in 2008 European Conference on Radiation and Its Effects on Components and Systems (01.09.2008)