Cumulated charging mechanisms at gate processing in high-κ first planar NMOS devices
Hiblot, Gaspard, Parihar, Narendra, Dupuy, Emmanuel, Mannaert, Geert, Baudot, Sylvain, Kaczer, Ben, Heyn, Vincent De, Mercha, Abdelkarim
Published in 2020 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2020)
Published in 2020 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2020)
Get full text
Conference Proceeding
A 0.65-to-1.4 nJ/Burst 3-to-10 GHz UWB All-Digital TX in 90 nm CMOS for IEEE 802.15.4a
Ryckaert, J., Van der Plas, G., De Heyn, V., Desset, C., Van Poucke, B., Craninckx, J.
Published in IEEE journal of solid-state circuits (01.12.2007)
Published in IEEE journal of solid-state circuits (01.12.2007)
Get full text
Journal Article
Conference Proceeding
A CMOS Ultra-Wideband Receiver for Low Data-Rate Communication
Ryckaert, J., Verhelst, M., Badaroglu, M., D'Amico, S., De Heyn, V., Desset, C., Nuzzo, P., Van Poucke, B., Wambacq, P., Baschirotto, A., Dehaene, W., Van der Plas, G.
Published in IEEE journal of solid-state circuits (01.11.2007)
Published in IEEE journal of solid-state circuits (01.11.2007)
Get full text
Journal Article
A 0.65-to-1.4nJ/burst 3-to-10GHz UWB Digital TX in 90nm CMOS for IEEE 802.15.4a
Ryckaert, Julien, van der Plas, Geert, de Heyn, Vincent, Desset, Claude, Vanwijnsberghe, Geert, van Poucke, Bart, Craninckx, Jan
Published in 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (01.02.2007)
Published in 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (01.02.2007)
Get full text
Conference Proceeding
A fast start-up 3GHz-10GHz digitally controlled oscillator for UWB impulse radio in 90nm CMOS
De Heyn, V., Van der Plas, G., Ryckaert, J., Craninckx, J.
Published in ESSCIRC 2007 - 33rd European Solid-State Circuits Conference (01.09.2007)
Published in ESSCIRC 2007 - 33rd European Solid-State Circuits Conference (01.09.2007)
Get full text
Conference Proceeding
Analog-Digital Partitioning for Low-Power UWB Impulse Radios under CMOS Scaling
Badaroglu, Mustafa, Desset, Claude, Ryckaert, Julien, De Heyn, Vincent, Van der Plas, Geert, Wambacq, Piet, Van Poucke, Bart
Published in EURASIP journal on wireless communications and networking (01.01.2006)
Published in EURASIP journal on wireless communications and networking (01.01.2006)
Get full text
Journal Article
Channel Length Dependence of PBTI in High-k First RMG Gate Stack Integration Scheme
Parihar, Narendra, Arutchelvan, Goutham, Franco, Jacopo, Baudot, Sylvain, Opedebeeck, Ann, Demuynck, Steven, Arimura, Hiroaki, Ragnarsson, Lars-Ake, Mitard, Jerome, De Heyn, Vincent, Mercha, Abdelkarim
Published in 2021 IEEE International Integrated Reliability Workshop (IIRW) (04.10.2021)
Published in 2021 IEEE International Integrated Reliability Workshop (IIRW) (04.10.2021)
Get full text
Conference Proceeding
Ultra-wide-band transmitter for low-power wireless body area networks: design and evaluation
Ryckaert, J., Desset, C., Fort, A., Badaroglu, M., De Heyn, V., Wambacq, P., Van der Plas, G., Donnay, S., Van Poucke, B., Gyselinckx, B.
Published in IEEE transactions on circuits and systems. I, Regular papers (01.12.2005)
Published in IEEE transactions on circuits and systems. I, Regular papers (01.12.2005)
Get full text
Journal Article
The Potential of FinFETs for Analog and RF Circuit Applications
Wambacq, P., Verbruggen, B., Scheir, K., Borremans, J., Dehan, M., Linten, D., De Heyn, V., Van der Plas, G., Mercha, A., Parvais, B., Gustin, C., Subramanian, V., Collaert, N., Jurczak, M., Decoutere, S.
Published in IEEE transactions on circuits and systems. I, Regular papers (01.11.2007)
Published in IEEE transactions on circuits and systems. I, Regular papers (01.11.2007)
Get full text
Journal Article
Analog-Digital Partitioning for Low-Power UWB Impulse Radios under CMOS Scaling
Badaroglu, Mustafa, Desset, Claude, Ryckaert, Julien, De Heyn, Vincent, Van der Plas, Geert, Wambacq, Piet, Van Poucke, Bart
Published in EURASIP journal on wireless communications and networking (23.01.2007)
Published in EURASIP journal on wireless communications and networking (23.01.2007)
Get full text
Journal Article
Analog and RF circuits in 45 nm CMOS and below: planar bulk versus FinFET
Wambacq, Piet, Jurczak, Malgorzata, Decoutere, Stefaan, Donnay, Stephane, Verbruggen, Bob, Scheir, Karen, Borremans, Jonathan, De Heyn, Vincent, Van der Plas, Geert, Mercha, Abdelkarim, Parvais, Bertrand, Subramanian, Vaidy
Published in 2006 Proceedings of the 32nd European Solid-State Circuits Conference (01.09.2006)
Published in 2006 Proceedings of the 32nd European Solid-State Circuits Conference (01.09.2006)
Get full text
Conference Proceeding
Significance of the failure criterion on transmission line pulse testing
Keppens, B., De Heyn, V., Natarajan Iyer, M., Vassilev, V., Groeseneken, G.
Published in Microelectronics and reliability (01.06.2002)
Published in Microelectronics and reliability (01.06.2002)
Get full text
Journal Article
Analog and RF circuits in 45 nm CMOS and below: planar bulk versus FinFET
Wambacq, P., Verbruggen, B., Scheir, K., Borremans, J., De Heyn, V., Van der Plas, G., Mercha, A., Parvais, B., Subramanian, V., Jurczak, M., Decoutere, S., Donnay, S.
Published in 2006 European Solid-State Device Research Conference (01.09.2006)
Published in 2006 European Solid-State Device Research Conference (01.09.2006)
Get full text
Conference Proceeding
Carrier-based UWB impulse radio: simplicity, flexibility, and pulser implementation in 0.18-micron CMOS
Ryckaert, J., Badaroglu, M., Desset, C., De Heyn, V., ven der Plas, G., Wambacq, P., van Poucke, B., Donnay, S.
Published in 2005 IEEE International Conference on Ultra-Wideband (2005)
Published in 2005 IEEE International Conference on Ultra-Wideband (2005)
Get full text
Conference Proceeding
Method of determining current-voltage characteristics of a device
Iyer, Natarajan Mahadeva, Thijs, Steven, Vassilev, Vesselin K, Daenen, Tom, Heyn, Vincent De
Year of Publication 20.02.2007
Get full text
Year of Publication 20.02.2007
Patent
Method of determining current-voltage characteristics of a device
HEYN VINCENT DE, IYER NATARAJAN MAHADEVA, VASSILEV VESSELIN K, THIJS STEVEN, DAENEN TOM
Year of Publication 20.02.2007
Get full text
Year of Publication 20.02.2007
Patent
Effect of the n+sinker in self-triggering bipolar ESD protection structures
De Heyn, Vincent, Iyer, Natarajan M, Groeseneken, Guido, Reynders, Koen, Moens, Peter
Published in 2002 Electrical Overstress/Electrostatic Discharge Symposium (01.10.2002)
Get full text
Published in 2002 Electrical Overstress/Electrostatic Discharge Symposium (01.10.2002)
Conference Proceeding
Method of determining current-voltage characteristics of a device
HEYN VINCENT DE, IYER NATARAJAN MAHADEVA, VASSILEV VESSELIN K, THIJS STEVEN, DAENEN TOM
Year of Publication 02.12.2004
Get full text
Year of Publication 02.12.2004
Patent
Plasma Charging Damage in HK-First and HK-Last RMG NMOS Devices
Hiblot, Gaspard, Parihar, Narendra, Dupuy, Emmanuel, Mannaert, Geert, Baudot, Sylvain, Kaczer, Ben, Franco, Jacopo, Vandooren, Anne, De Heyn, Vincent, Mercha, Abdelkarim
Published in IEEE transactions on device and materials reliability (01.06.2021)
Published in IEEE transactions on device and materials reliability (01.06.2021)
Get full text
Magazine Article