by Stoldt, H., Theuwissen, A.J.P., Vledder, F.F., Centen, P.G.M., Mierop, A., Kleimann, A.C.M., Peek, H.L., Verbugt, D.W.E., Hartog, P.B., de Gruyter, R.H.S.
Published in International Electron Devices Meeting. Technical Digest (1996)