Currents and charge profiles in electron beam irradiated samples under an applied voltage: exact numerical calculation and Sessler's conductivity approximation
Leal Ferreira, G.F., de Figueiredo, M.T.
Published in IEEE transactions on dielectrics and electrical insulation (01.02.2003)
Published in IEEE transactions on dielectrics and electrical insulation (01.02.2003)
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Journal Article
Secondary emission impaired by charge accumulation in dielectrics: the dynamical method
Leal Ferreira, G.F., de Figueiredo, M.T.
Published in 2005 12th International Symposium on Electrets (2005)
Published in 2005 12th International Symposium on Electrets (2005)
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Conference Proceeding