Identifying and fixing in-plane positioning and stability issues on a microscope using machine-readable patterned position scales
Acher, Olivier, de Abreu, Matheus Belisario, Grigoriev, Alexander, de Bettignies, Philippe, Vilotta, Maxime, Nguyên, Thanh-Liêm
Published in Scientific reports (09.11.2023)
Published in Scientific reports (09.11.2023)
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