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Knob non-idealities in learning-based post-production tuning of analog/RF ICs: Impact & remedies
Yichuan Lu, Volanis, Georgios, Subramani, Kiruba S., Antonopoulos, Angelos, Makris, Yiorgos
Published in Proceedings - IEEE VLSI Test Symposium (01.04.2017)
Published in Proceedings - IEEE VLSI Test Symposium (01.04.2017)
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Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs
Ahmadi, Ali, Nahar, Amit, Orr, Bob, Past, Michael, Makris, Yiorgos
Published in Proceedings - IEEE VLSI Test Symposium (01.04.2016)
Published in Proceedings - IEEE VLSI Test Symposium (01.04.2016)
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Innovative Materials, Devices, and CMOS Technologies for Low-Power Mobile Multimedia
Skotnicki, Thomas, Fenouillet-Beranger, Claire, Gallon, Claire, Boeuf, Frederic, Monfray, Stephane, Payet, Fabrice, Pouydebasque, Arnaud, Szczap, Melanie, Farcy, Alexis, Arnaud, Franck, Clerc, Sylvain, Sellier, Manuel, Cathignol, Augustin, Schoellkopf, Jean-Pierre, Perea, Ernesto, Ferrant, Richard, Mingam, Herve
Published in IEEE transactions on electron devices (01.01.2008)
Published in IEEE transactions on electron devices (01.01.2008)
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Materials and device structures for sub-32 nm CMOS nodes
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Study of process induced variability of germanium-pTFET in analog and RF domain
Ghosh, Sayani, Koley, Kalyan, Sarkar, Chandan K.
Published in Microelectronics and reliability (01.10.2016)
Published in Microelectronics and reliability (01.10.2016)
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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs
Azais, F., Bernard, S., Comte, M., Deveautour, B., Dupuis, S., Badawi, H. El, Flottes, M.-L., Girard, P., Kerzerho, V., Latorre, L., Lefevre, F., Rouzeyre, B., Valea, E., Vayssadel, T., Virazel, A.
Published in Proceedings / IEEE International On-Line Testing Symposium (01.07.2020)
Published in Proceedings / IEEE International On-Line Testing Symposium (01.07.2020)
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SoC Design Quality, Cycletime, and Yield Improvement Through DfM
Cetin, J., Balasinski, A.
Published in 2006 6th International Workshop on Systemon Chip for Real Time Applications (01.12.2006)
Published in 2006 6th International Workshop on Systemon Chip for Real Time Applications (01.12.2006)
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Measurement and modelling of 1/f noise in 180 nm NMOS and PMOS devices
Mavredakis, N, Antonopoulos, A, Bucher, M
Published in 2010 5th European Conference on Circuits and Systems for Communications (01.11.2010)
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Published in 2010 5th European Conference on Circuits and Systems for Communications (01.11.2010)
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Press Release: MACOM Successfully Completes Acquisition of AppliedMicro
Published in Dow Jones Institutional News
(26.01.2017)
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