Thin-film optical function acquisition from experimental measurements of the reflectance and transmittance spectra: a case study
Moghaddam, Saeed, Cheung, Sin Hang, Noël, Mario, Zwinkels, Joanne C., Baribeau, Jean-Marc, Lockwood, David J., O’Leary, Stephen K.
Published in Journal of materials science. Materials in electronics (01.07.2021)
Published in Journal of materials science. Materials in electronics (01.07.2021)
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Journal Article
Photometry, radiometry and 'the candela': evolution in the classical and quantum world
Zwinkels, Joanne C, Ikonen, Erkki, Fox, Nigel P, Ulm, Gerhard, Rastello, Maria Luisa
Published in Metrologia (01.10.2010)
Published in Metrologia (01.10.2010)
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Journal Article
Investigation of converging and collimated beam instrument geometry on specular gloss measurements
Zwinkels, Joanne C., Côté, Éric, Morgan, John
Published in Journal of physics. Conference series (01.02.2018)
Published in Journal of physics. Conference series (01.02.2018)
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Journal Article
Influence of the growth temperature on the spectral dependence of the optical functions associated with thin silicon films grown by ultra-high-vacuum evaporation on optical quality fused quartz substrates
Moghaddam, Saeed, Orapunt, Farida, Noël, Mario, Zwinkels, Joanne C., Baribeau, Jean-Marc, Lockwood, David J., O’Leary, Stephen K.
Published in Journal of materials science. Materials in electronics (01.08.2020)
Published in Journal of materials science. Materials in electronics (01.08.2020)
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Journal Article
State-of-the art comparability of corrected emission spectra. 1. Spectral correction with physical transfer standards and spectral fluorescence standards by expert laboratories
Resch-Genger, Ute, Bremser, Wolfram, Pfeifer, Dietmar, Spieles, Monika, Hoffmann, Angelika, DeRose, Paul C, Zwinkels, Joanne C, Gauthier, François, Ebert, Bernd, Taubert, R Dieter, Monte, Christian, Voigt, Jan, Hollandt, Jörg, Macdonald, Rainer
Published in Analytical chemistry (Washington) (01.05.2012)
Published in Analytical chemistry (Washington) (01.05.2012)
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Journal Article
State-of-the Art Comparability of Corrected Emission Spectra.1. Spectral Correction with Physical Transfer Standards and Spectral Fluorescence Standards by Expert Laboratories
Resch-Genger, Ute, Bremser, Wolfram, Pfeifer, Dietmar, Spieles, Monika, Hoffmann, Angelika, DeRose, Paul C, Zwinkels, Joanne C, Gauthier, François, Ebert, Bernd, Taubert, R. Dieter, Monte, Christian, Voigt, Jan, Hollandt, Jörg, Macdonald, Rainer
Published in Analytical chemistry (Washington) (01.05.2012)
Published in Analytical chemistry (Washington) (01.05.2012)
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Journal Article
State-of-the Art Comparability of Corrected Emission Spectra. 2. Field Laboratory Assessment of Calibration Performance Using Spectral Fluorescence Standards
Resch-Genger, Ute, Bremser, Wolfram, Pfeifer, Dietmar, Spieles, Monika, Hoffmann, Angelika, DeRose, Paul C, Zwinkels, Joanne C, Gauthier, François, Ebert, Bernd, Taubert, R. Dieter, Voigt, Jan, Hollandt, Jörg, Macdonald, Rainer
Published in Analytical chemistry (Washington) (01.05.2012)
Published in Analytical chemistry (Washington) (01.05.2012)
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Journal Article
An International Evaluation of Holmium Oxide Solution Reference Materials for Wavelength Calibration in Molecular Absorption Spectrophotometry
Travis, John C, Zwinkels, Joanne C, Mercader, Flora, Ruíz, Arquímedes, Early, Edward A, Smith, Melody V, Noël, Mario, Maley, Marissa, Kramer, Gary W, Eckerle, Kenneth L, Duewer, David L
Published in Analytical chemistry (Washington) (15.07.2002)
Published in Analytical chemistry (Washington) (15.07.2002)
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Journal Article
Crystallinity, order, the thin-film silicon continuum, and the spectral dependence of the refractive index in thin silicon films grown through ultra-high-vacuum evaporation for a range of growth temperatures
Moghaddam, Saeed, Tay, Li-Lin, Noël, Mario, Zwinkels, Joanne C., Baribeau, Jean-Marc, Lockwood, David J., O’Leary, Stephen K.
Published in Journal of non-crystalline solids (01.05.2021)
Published in Journal of non-crystalline solids (01.05.2021)
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Journal Article
An amorphous-to-crystalline phase transition within thin silicon films grown through ultra-high-vacuum evaporation on fused quartz substrates
Orapunt, Farida, Tay, Li-Lin, Lockwood, David J., Baribeau, Jean-Marc, Zwinkels, Joanne C., Noël, Mario, O’Leary, Stephen K.
Published in MRS advances (01.01.2016)
Published in MRS advances (01.01.2016)
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Journal Article
Specular gloss scales comparison between the National Institute of Standards and Technology and the National Research Council of Canada
NADAL, Maria E, ZWINKELS, Joanne C, NOEL, Mario
Published in JCT, Journal of Coatings Technology (01.08.2003)
Published in JCT, Journal of Coatings Technology (01.08.2003)
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Journal Article
Trade Publication Article
Instrumentation, standards, and procedures used at the National Research Council of Canada for high-accuracy fluorescence measurements
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Journal Article
Conference Proceeding