A study on IGBT junction temperature (Tj) online estimation using gate-emitter voltage (Vge) at turn-off
Sundaramoorthy, V.K., Bianda, E., Bloch, R., Angelosante, D., Nistor, I., Riedel, G.J., Zurfluh, F., Knapp, G., Heinemann, A.
Published in Microelectronics and reliability (01.11.2014)
Published in Microelectronics and reliability (01.11.2014)
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Journal Article
A feasibility study of using gate-emitter voltage method to estimate IGBT online junction temperature in practical applications
Riedel, G. J., Sundaramoorthy, V. K., Bianda, E., Bloch, R., Zurfluh, F.
Published in 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe) (01.09.2015)
Published in 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe) (01.09.2015)
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Conference Proceeding