Characterization of multiple-bit errors from single-ion tracks in integrated circuits
Zoutendyk, J.A., Edmonds, L.D., Smith, L.S.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1989)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1989)
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Journal Article
Conference Proceeding
Response of a DRAM to single-ion tracks of different heavy-ion species and stopping powers
Zoutendyk, J.A., Smith, L.S., Edmonds, L.D.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)
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Journal Article
Conference Proceeding
Lateral charge transport from heavy-ion tracks in integrated circuit chips
Zoutendyk, J.A., Schwartz, H.R., Nevill, L.R.
Published in IEEE transactions on nuclear science (01.12.1988)
Published in IEEE transactions on nuclear science (01.12.1988)
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Journal Article
Single-Event Upset (SEU) in a Dram with On-Chip Error Correction
Zoutendyk, J. A., Schwartz, H. R., Watson, R. K., Hasnain, Z., Nevill, L. R.
Published in IEEE transactions on nuclear science (01.12.1987)
Published in IEEE transactions on nuclear science (01.12.1987)
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Journal Article
Investigation of single-event upset (SEU) in an advanced bipolar process
Zoutendyk, J.A., Secrest, E.C., Berndt, D.F.
Published in IEEE transactions on nuclear science (01.12.1988)
Published in IEEE transactions on nuclear science (01.12.1988)
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Journal Article
CMOS-ASIC life-predictions from test-coupon data
Buehler, M.G., Zamani, N., Zoutendyk, J.A.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)
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Conference Proceeding
Journal Article