by Thompto, Brian W., Nguyen, Dung Q., Moreira, Jose E., Bertran, Ramon, Jacobson, Hans, Eickemeyer, Richard J., Rao, Rahul M., Goulet, Michael, Byers, Marcy, Gonzalez, Christopher J., Swaminathan, Karthik, Dhanwada, Nagu R., Muller, Silvia M., Wagner, Andreas, Sadasivam, Satish Kumar, Montoye, Robert K., Starke, William J., Zoellin, Christian G., Floyd, Michael S., Stuecheli, Jeffrey, Chandramoorthy, Nandhini, Wellman, John-David, Buyuktosunoglu, Alper, Pflanz, Matthias, Sinharoy, Balaram, Bose, Pradip
Published in 2021 ACM/IEEE 48th Annual International Symposium on Computer Architecture (ISCA) (01.06.2021)

by Zoellin, C., Wunderlich, H.J., Maeding, N., Leenstra, J.
Published in 2006 IEEE International Test Conference (01.10.2006)

by Kochte, Michael A, Schaal, Marcel, Wunderlich, Hans-Joachim, Zoellin, Christian G
Published in Design Automation Conference (01.06.2010)

by Baranowski, Rafal, Di Carlo, Stefano, Hatami, Nadereh, Imhof, Michael E., Kochte, Michael A., Prinetto, Paolo, Wunderlich, Hans-Joachim, Zoellin, Christian G.
Published in Science China. Information sciences (01.09.2011)

by Kochte, Michael A., Zoellin, Christian G., Wunderlich, Hans-Joachim
Published in Journal of electronic testing (01.10.2010)

by Zoellin, Christian G, Wunderlich, Hans-Joachim
Published in 2010 28th VLSI Test Symposium (VTS) (01.04.2010)

by Imhof, Michael E., Zoellin, Christian G., Wunderlich, Hans-Joachim, Maeding, Nicolas, Leenstra, Jens
Published in 2007 44th ACM/IEEE Design Automation Conference (04.06.2007)

by Elm, Melanie, Wunderlich, Hans-Joachim, Imhof, Michael E., Zoellin, Christian G., Leenstra, Jens, Maeding, Nicolas
Published in 2008 45th ACM/IEEE Design Automation Conference (08.06.2008)

by PURANIK ADITYA NITIN, SLEGEL TIMOTHY, RECKTENWALD MARTIN, ZOELLIN CHRISTIAN GERHARD, BRADBURY JONATHAN, SCHMIDT DONALD WILLIAM, FARRELL MARK, JACOBI CHRISTIAN, GIAMEI BRUCE CONRAD
Year of Publication 17.05.2021

by Jaschke, Christoph, Herter, Ulla, Wolkober, Claudia, Schmitt, Carsten, Zoellin, Christian
Published in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 (01.03.2017)

by PURANIK ADITYA NITIN, SLEGEL TIMOTHY, VISEGRADY TAMAS, PAPROTSKI VOLODYMYR, BUENDGEN REINHARD THEODOR, ZOELLIN CHRISTIAN, BRADBURY JONATHAN, GREINER DAN, JACOBI CHRISTIAN
Year of Publication 31.05.2019

by Berry, Christopher, Warnock, James, Isakson, John, Badar, John, Bell, Brian, Malgioglio, Frank, Mayer, Guenter, Hamid, Dina, Surprise, Jesse, Wolpert, David, Geva, Ofer, Huott, Bill, Sigal, Leon, Carey, Sean, Rizzolo, Richard, Nigaglioni, Ricardo, Cichanowski, Mark, Chidambarrao, Dureseti, Jacobi, Christian, Saporito, Anthony, O'neill, Arthur, Sonnelitter, Robert, Zoellin, Christian, Wood, Michael, Neves, Jose
Published in 2018 IEEE International Solid - State Circuits Conference - (ISSCC) (01.02.2018)

by Bradly George Frey, Christian Zoellin, Debapriya Chatterjee, Brian Thompto
Year of Publication 14.02.2024

by SLEGEL, Timothy, ZOELLIN, Christian, GREINER, Dan
Year of Publication 28.05.2022

by Chatterjee, Debapriya, Thompto, Brian W, Zoellin, Christian, Frey, Bradly George
Year of Publication 25.01.2024

by Chatterjee, Debapriya, Thompto, Brian W, Zoellin, Christian, Frey, Bradly George
Year of Publication 24.10.2023

by Bradly George Frey, Christian Zoellin, Debapriya Chatterjee, Brian Thompto
Year of Publication 18.10.2023

by ZOELLIN, CHRISTIAN, SLEGEL, TIMOTHY, GREINER, DAN
Year of Publication 07.02.2022

by SLEGEL, Timothy, ZOELLIN, Christian, GREINER, Dan
Year of Publication 24.11.2021

by LEVENSTEIN, Sheldon, ORZOL, Nicholas, ZOELLIN, Christian, CAMPBELL, David
Year of Publication 15.12.2022