Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies
Badaroglu, M., Donnay, S., De Man, H.J., Zinzius, Y.A., Gielen, G.G.E., Sansen, W., Fonden, T., Signell, S.
Published in IEEE journal of solid-state circuits (01.07.2003)
Published in IEEE journal of solid-state circuits (01.07.2003)
Get full text
Journal Article