TESTING FOR CORRECT UNDERCUTTING OF AN ELECTRODE DURING AN ETCHING STEP
GOPALAN ZINGG SUDHA, MARTENS THEODORUS H.G, ZINGG RENE P, DOORNVELD HERMAN E
Year of Publication 29.07.2010
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Year of Publication 29.07.2010
Patent
TESTING FOR CORRECT UNDERCUTTING OF AN ELECTRODE DURING AN ETCHING STEP
DOORNVELD, HERMAN, E, MARTENS, THEODORUS, H., G, GOPALAN ZINGG, SUDHA, ZINGG, RENE, P
Year of Publication 06.05.2009
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Year of Publication 06.05.2009
Patent
TESTING FOR CORRECT UNDERCUTTING OF AN ELECTRODE DURING AN ETCHING STEP
DOORNVELD, HERMAN, E, MARTENS, THEODORUS, H., G, GOPALAN ZINGG, SUDHA, ZINGG, RENE, P
Year of Publication 17.07.2008
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Year of Publication 17.07.2008
Patent
TESTING FOR CORRECT UNDERCUTTING OF AN ELECTRODE DURING AN ETCHING STEP
DOORNVELD, HERMAN, E, MARTENS, THEODORUS, H., G, GOPALAN ZINGG, SUDHA, ZINGG, RENE, P
Year of Publication 21.02.2008
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Year of Publication 21.02.2008
Patent
Stacked CMOS inverter with symmetric device performance
Zingg, R.P., Hofflinger, B., Neudeck, G.W.
Published in International Technical Digest on Electron Devices Meeting (1989)
Published in International Technical Digest on Electron Devices Meeting (1989)
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Conference Proceeding