Study of RBSOA reliability of nanoscale Partially Narrow Mesa IGBT (PNM-IGBT)
Jiang Lu, Hainan Liu, Jiajun Luo, Lixin Wang, Guohuan Zhang, Zhengsheng Han
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
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Conference Proceeding
The ESD Characteristics of a pMOS-Triggered Bidirectional SCR in SOI BCD Technology
Li, Mingzhu, Cai, Xiaowu, Zeng, Chuanbin, Li, Xiaojing, Ni, Tao, Wang, Juanjuan, Li, Duoli, Zhao, Fazhan, Han, Zhengsheng
Published in Electronics (Basel) (01.02.2022)
Published in Electronics (Basel) (01.02.2022)
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Journal Article
Multiple Angle Analysis of 30-MeV Silicon Ion Beam Radiation Effects on InGaN/GaN Multiple Quantum Wells Blue Light-Emitting Diodes
Wang, Lei, Liu, Ningyang, Song, Ligang, Li, Bo, Liu, Yanqiu, Cui, Yan, Li, Binhong, Zheng, Zhongshan, Chen, Zhitao, Gong, Zheng, Zhao, Wei, Cao, Xingzhong, Wang, Baoyi, Luo, Jiajun, Han, Zhengsheng
Published in IEEE transactions on nuclear science (01.11.2018)
Published in IEEE transactions on nuclear science (01.11.2018)
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Journal Article
Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET
Zhang, Xinyi, Wang, Kewei, Wang, Fang, Li, Jiangjiang, Wu, Zhicheng, Li, Duoli, Li, Bo, Bu, Jianhui, Han, Zhengsheng
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Failure analysis of the VDMOS device with Vsd and Rds (on) exceeded limit based on reliability physics
Qing Li, Bo Gao, Haitao Deng, Lulu Wang, Dandan Yang, Lixin Wang, Jiajun Luo, Zhengsheng Han
Published in 2016 Prognostics and System Health Management Conference (PHM-Chengdu) (01.10.2016)
Published in 2016 Prognostics and System Health Management Conference (PHM-Chengdu) (01.10.2016)
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Conference Proceeding
The Effects of \gamma Radiation-Induced Trapped Charges on Single Event Transient in DSOI Technology
Wang, Yuchong, Chen, Siyuan, Liu, Fanyu, Li, Bo, Li, Jiangjiang, Huang, Yang, Zhang, Tiexin, Zhang, Xu, Han, Zhengsheng, Ye, Tianchun, Wan, Jing
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Radiation damage and abnormal photoluminescence enhancement of multilayer MoS2under neutron irradiation
Xiong, Guodong, Zhu, Huiping, Wang, Lei, Fan, Linsheng, Zheng, Zhongshan, Li, Bo, Zhao, Fazhan, Han, Zhengsheng
Published in Journal of physics. Condensed matter (11.11.2021)
Published in Journal of physics. Condensed matter (11.11.2021)
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Journal Article
3D TCAD simulation of single-event-effect in n-channel transistor based on deep sub-micron fully-depleted silicon-on-insulator technology
Jinshun Bi, Bo Li, Zhengsheng Han, Jiajun Luo, Li Chen, Xuefang Lin-Shi
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
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Conference Proceeding
Applications of Direct-Current Current–Voltage Method to Total Ionizing Dose Radiation Characterization in SOI NMOSFETs with Different Process Conditions
Li, Yangyang, Zeng, Chuanbin, Li, Xiaojing, Gao, Linchun, Yan, Weiwei, Li, Duoli, Zhang, Yi, Han, Zhengsheng, Luo, Jiajun
Published in Electronics (Basel) (01.04.2021)
Published in Electronics (Basel) (01.04.2021)
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Journal Article
A digital direct controller for buck converter
Bo Li, Jinshun Bi, Zhengsheng Han, Jiajun Luo, Xuefang Lin-Shi, Allard, Bruno, Li Chen
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
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Conference Proceeding
A 6-GHz 78-fs RMS Double-Sampling PLL With Low-Ripple Bootstrapped DSPD and Retimer-Less MMD Achieving −92-dBc Reference Spur and −258-dB FOM
Ren, Hongyu, Yang, Zunsong, Huang, Yunbo, Feng, Chaoping, Chen, Tianle, Zhang, Xinming, Meng, Xianghe, Yan, Weiwei, Zhang, Weidong, Iizuka, Tetsuya, Chen, Yong, Mak, Pui-In, Han, Zhengsheng, Li, Bo
Published in IEEE microwave and wireless technology letters (Print) (01.05.2024)
Published in IEEE microwave and wireless technology letters (Print) (01.05.2024)
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Journal Article
A 6-GHz 78-fsRMS Double-Sampling PLL With Low-Ripple Bootstrapped DSPD and Retimer-Less MMD Achieving −92-dBc Reference Spur and −258-dB FOM
Ren, Hongyu, Yang, Zunsong, Huang, Yunbo, Feng, Chaoping, Chen, Tianle, Zhang, Xinming, Meng, Xianghe, Yan, Weiwei, Zhang, Weidong, Iizuka, Tetsuya, Chen, Yong, Mak, Pui-In, Han, Zhengsheng, Li, Bo
Published in IEEE microwave and wireless technology letters (Print) (01.05.2024)
Published in IEEE microwave and wireless technology letters (Print) (01.05.2024)
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Journal Article
Mechanism Analysis of Proton Irradiation-Induced Increase of 3-dB Bandwidth of GaN-Based Microlight-Emitting Diodes for Space Light Communication
Wang, Lei, Pan, Zhangxu, Li, Bo, Wang, Junjun, Guan, Xiaojun, Wang, Ju, Liu, Ningyang, Wang, Shufeng, Zhang, Xuewen, Gu, Rui, Gong, Zheng, Wei, Zhengjun, Zhu, Huiping, Liu, Naixin, Li, Binhong, Gao, Jiantou, Huang, Yang, Liu, Mengxin, Yang, Jianqun, Li, Xingji, Luo, Jiajun, Han, Zhengsheng, Liu, Xinyu
Published in IEEE transactions on nuclear science (01.07.2020)
Published in IEEE transactions on nuclear science (01.07.2020)
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Journal Article
Snapback-free RC-LIGBT with integrated LDMOS and LIGBT
Chen, Weizhong, Li, Shun, Huang, Yao, Huang, Yi, He, LiJun, Han, ZhengSheng
Published in Micro & nano letters (05.02.2020)
Published in Micro & nano letters (05.02.2020)
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Journal Article
Single-event burnout hardening of planar power MOSFET with partially widened trench source
Lu, Jiang, Liu, Hainan, Cai, Xiaowu, Luo, Jiajun, Li, Bo, Li, Binhong, Wang, Lixin, Han, Zhengsheng
Published in Journal of semiconductors (01.03.2018)
Published in Journal of semiconductors (01.03.2018)
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Journal Article
Radiation hardness and abnormal photoresponse dynamics of the CH3NH3PbI3 perovskite photodetector
Xiong, Guodong, Qin, Zilun, Li, Bo, Wang, Lei, Zhang, Xuewen, Zheng, Zhongshan, Zhu, Huiping, Zhao, Suling, Gao, Jiantou, Li, Binhong, Yang, Jianqun, Li, Xingji, Luo, Jiajun, Han, Zhengsheng, Liu, Xinyu, Zhao, Fazhan
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (01.01.2021)
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (01.01.2021)
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Journal Article
Single event transients in PDSOI CMOS inverter chain irradiated by pulsed laser
Xing Zhao, Bo Mei, Jinshun Bi, Zhongshan Zheng, Linchun Gao, Chuanbin Zeng, Jiajun Luo, Fang Yu, Zhengsheng Han
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
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Conference Proceeding
Influence of deposited energy in sensitive volume on temperature dependence of SEU sensitivity in SRAM devices
Tianqi Liu, Jie Liu, Chao Geng, Zhangang Zhang, Fazhan Zhao, Teng Tong, Youmei Sun, Hong Su, Huijun Yao, Song Gu, Kai Xi, Jie Luo, Gang Liu, Zhengsheng Han, Mingdong Hou
Published in 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2013)
Published in 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2013)
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Conference Proceeding
Theoretical modification of the negative Miller capacitance during the switching transients of IGBTsProject supported by the National Major Science and Technology Special Project (No. 2013ZX02305005-002), and the National Natural Science Foundation Major Program (No. 51490681)
Teng, Yuan, Zhu, Yangjun, Han, Zhengsheng, Ye, Tianchun
Published in Journal of semiconductors (01.07.2016)
Published in Journal of semiconductors (01.07.2016)
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Journal Article