Experimental Investigation of Ballistic Carrier Transport for Sub-100-nm Ge n-MOSFETs
Ran Cheng, Longxiang Yin, Heng Wu, Xiao Yu, Yanyan Zhang, Zejie Zheng, Wangran Wu, Bing Chen, Ye, Peide D., Xiaoyan Liu, Yi Zhao
Published in IEEE electron device letters (01.04.2017)
Published in IEEE electron device letters (01.04.2017)
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Journal Article
Strong photoluminescence from ultrathin silicon (110) quantum wells at room temperature
Zhu, Xiaodong, Lu, Jiwu, Gao, Yuhan, Yuan, Shuai, Zhou, Ning, Xie, Min, Zheng, Zejie, Zhao, Yi
Published in Japanese Journal of Applied Physics (01.02.2017)
Published in Japanese Journal of Applied Physics (01.02.2017)
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Journal Article
Ultrafast pulse characterization of hot carrier injection effects on ballistic carrier transport for sub-100 nm MOSFETs
Ran Cheng, Xiao Yu, Lei Shen, Longxiang Yin, Yanyan Zhang, Zejie Zheng, Bing Chen, Xiaoyan Liu, Yi Zhao
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Triple-enhanced Raman scattering sensor based on superhydrophobic/-philic microsphere platform and heating evaporation assisted for high-sensitivity detection
Yu, Jian, Gu, Guoqiang, Qu, Chiye, Zheng, Zejie, Yang, Huan, Lu, Lianyu, Chen, Ming, Yang, Hui
Published in Sensors and actuators. B, Chemical (01.11.2024)
Published in Sensors and actuators. B, Chemical (01.11.2024)
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Journal Article
Ultra fast (<1 ns) electrical characterization of self-heating effect and its impact on hot carrier injection in 14nm FinFETs
Yiming Qu, Xi Lin, Junkang Li, Ran Cheng, Xiao Yu, Zejie Zheng, Jiwu Lu, Bing Chen, Yi Zhao
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
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Conference Proceeding
Back-Gate Modulation in UTB GeOI pMOSFETs With Advanced Substrate Fabrication Technique
Zheng, Zejie, Yu, Xiao, Zhang, Yanyan, Xie, Min, Cheng, Ran, Zhao, Yi
Published in IEEE transactions on electron devices (01.03.2018)
Published in IEEE transactions on electron devices (01.03.2018)
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Journal Article
Real-Time Polarization Switch Characterization of HfZrO4 for Negative Capacitance Field-Effect Transistor Applications
Zheng, Zejie, Cheng, Ran, Qu, Yiming, Yu, Xiao, Liu, Wei, Chen, Zhuo, Chen, Bing, Sun, Qingqing, Zhang, David Wei, Zhao, Yi
Published in IEEE electron device letters (01.09.2018)
Published in IEEE electron device letters (01.09.2018)
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Journal Article
Rapid and Quantitative Analysis of Exosomes by a Chemiluminescence Immunoassay Using Superparamagnetic Iron Oxide Particles
Wang, Yiyun, Liu, Zhenping, Wang, Xuchu, Dai, Yibei, Li, Xiaoying, Gao, Shifan, Yu, Pan, Lin, Qinyan, Fan, Zihao, Ping, Ying, Wang, Danhua, Lin, Xuedan, Zheng, Zejie, Liu, Weiwei, Tao, Zhihua
Published in Journal of biomedical nanotechnology (01.08.2019)
Published in Journal of biomedical nanotechnology (01.08.2019)
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Journal Article
Comparative investigation into the interface passivation of Ge n- and p-MOSFETs with various 2D materials
Wu, Wangran, Zheng, Zejie, Sun, Weifeng, Xu, Shun, Li, Junkang, Zhang, Rui, Zhao, Yi
Published in Applied physics express (01.10.2019)
Published in Applied physics express (01.10.2019)
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Journal Article
Real-Time Polarization Switch Characterization of HfZrO 4 for Negative Capacitance Field-Effect Transistor Applications
Zheng, Zejie, Cheng, Ran, Qu, Yiming, Yu, Xiao, Liu, Wei, Chen, Zhuo, Chen, Bing, Sun, Qingqing, Zhang, David Wei, Zhao, Yi
Published in IEEE electron device letters (01.09.2018)
Published in IEEE electron device letters (01.09.2018)
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Journal Article
Reduction in Modulus of Suspended Sub‐2 nm Single Crystalline Silicon Nanomembranes
Zhu, Xiaodong, Lu, Jiwu, Pan, Haihua, Zheng, Zejie, Pi, Xiaodong, Zhao, Yi
Published in Advanced materials interfaces (09.10.2017)
Published in Advanced materials interfaces (09.10.2017)
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Journal Article
Ge CMOS technology with advanced interface and junction engineering
Zhao, Yi, Zheng, Zejie, Li, Junkang, Ni, Dong, Zhang, Rui
Published in 2018 International Conference on IC Design & Technology (ICICDT) (01.06.2018)
Published in 2018 International Conference on IC Design & Technology (ICICDT) (01.06.2018)
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Conference Proceeding