Determination of the transport properties in 4H-SiC wafers by Raman scattering measurement
Sun, Guo-Sheng (国胜 孙), Liu, Xing-Fang (兴防 刘), Wu, Hai-Lei (海雷 吴), Yan, Guo-Guo (果果 闫), Dong, Lin (林董), Zheng, Liu (柳郑), Zhao, Wan-Shun (万顺 赵), Wang, Lei (雷王), Zeng, Yi-Ping (一平 曾), Li, Xi-Guang (锡光 李), Wang, Zhan-Guo (占国 王)
Published in Chinese physics B (01.03.2011)
Published in Chinese physics B (01.03.2011)
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