The Fluctuation Effect of Remnant Polarization in Hf₀.₅Zr₀.₅O₂ Capacitors at Elevated Temperatures
Gao, Zhaomeng, Zheng, Yunzhe, Xin, Tianjiao, Liu, Cheng, Zhao, Qiwendong, Xu, Yilin, Zheng, Yonghui, Lin, Xiaoling, Lyu, Hangbing, Cheng, Yan
Published in IEEE electron device letters (01.10.2024)
Published in IEEE electron device letters (01.10.2024)
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Journal Article
Polar Axis Orientation Control of Hafnium-Based Ferroelectric Capacitors with in-Situ AC Electric Bias During Rapid Thermal Annealing
Gao, Zhaomeng, Xin, Tianjiao, Kai, D., Zhao, Qiwendong, Wang, Yiwei, Liu, Cheng, Yilin, X., Wang, Rui, Shi, Guangjie, Zheng, Yunzhe, Zheng, Yonghui, Cheng, Yan, Lyu, Hangbing
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
Structure evolution path of ferroelectric hafnium zirconium oxide nanocrystals under in-situ biasing
Zheng, Yunzhe, Yu, Heng, Xin, Tianjiao, Xue, Kan-Hao, Xu, Yilin, Gao, Zhaomeng, Liu, Cheng, Zhao, Qiwendong, Zheng, Yonghui, Miao, Xiangshui, Cheng, Yan
Year of Publication 17.09.2024
Year of Publication 17.09.2024
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Journal Article
Structure evolution path of ferroelectric hafnium zirconium oxide nanocrystals under in-situ biasing
Zheng, Yunzhe, Yu, Heng, Tianjiao Xin, Kan-Hao Xue, Xu, Yilin, Gao, Zhaomeng, Liu, Cheng, Zhao, Qiwendong, Zheng, Yonghui, Miao, Xiangshui, Cheng, Yan
Published in arXiv.org (17.09.2024)
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Published in arXiv.org (17.09.2024)
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