A Light-Weighted CNN Model for Wafer Structural Defect Detection
Chen, Xiaoyan, Chen, Jianyong, Han, Xiaoguang, Zhao, Chundong, Zhang, Dongyang, Zhu, Kuifeng, Su, Yanjie
Published in IEEE access (2020)
Published in IEEE access (2020)
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Journal Article
A compact Robot-based defect detection device design for silicon wafer
Chen, Xiaoyan, Zhao, Chundong, Chen, Jianyong, Zhang, Dongyang, Zhu, Kuifeng, Su, Yanjie
Published in Journal of physics. Conference series (01.01.2020)
Published in Journal of physics. Conference series (01.01.2020)
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Journal Article
Effect of Charge Non-Uniformity on the Lithium Dendrites and Improvement by the LiF Interfacial Layer
You, Yiwei, Zheng, Feng, Zhang, Dexin, Zhao, Chundong, Hu, Chunhua, Cao, Xinrui, Zhu, Zi-zhong, Wu, Shunqing
Published in ACS applied energy materials (26.12.2022)
Published in ACS applied energy materials (26.12.2022)
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Journal Article
K-means clustering with morphological filtering for silicon wafer grain defect detection
Chen, Xiaoyan, Zhao, Chundong, Chen, Jianyong, Zhang, Dongyang, Zhu, Kuifeng, Su, Yanjie
Published in 2020 IEEE 4th Information Technology, Networking, Electronic and Automation Control Conference (ITNEC) (01.06.2020)
Published in 2020 IEEE 4th Information Technology, Networking, Electronic and Automation Control Conference (ITNEC) (01.06.2020)
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