Next Generation Gate-all-around Device Design for Continued Scaling Beyond 2 nm Logic
Vyas, Pratik B., Zhao, Charisse, Dag, Sefa, Pal, Ashish, Bazizi, El Mehdi, Ayyagari-Sangamalli, Buvna
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
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Conference Proceeding
Materials to System Co-optimization (MSCO™) for SRAM and its application towards Gate-All-Around Technology
Vyas, Pratik B., Pal, Ashish, Costrini, Gregory, Asenov, Plamen, Mhedhbi, Sarra, Zhao, Charisse, Moroz, Victor, Colombeau, Benjamin, Haran, Bala, Bazizi, El Mehdi, Ayyagari-Sangamalli, Buvna
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
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Conference Proceeding
Novel Material, Process and Device Innovations for Next Generation Silicon Carbide (SiC) Trench MOSFET Technology
Vyas, Pratik B., Megalini, Ludovico, Pal, Ashish, Holt, Joshua, Kumar, Archana, Weeks, Stephen, Zhao, Charisse, Date, Lucien, Lo, Hansel, Khoury, Michel, Muhammad, Safdar, Piallat, Fabian, Fang, Ricky, Charles, William, Palit, Pratim, Yang, Jinghe, Zhang, Qintao, Oh, Jang Seok, Turner, Bryan, Hong, Samphy, Pitchiya, Aswin Prathap, Briggs, Benjamin, Yang, Jiao, Yang, Dae, Wang, Fengshou, Lee, Joseph, Prabhu, Gopal, Ho, Dustin, Caballero, Carlos, Chaturvedula, Durga, Yuan, Zheng, Zheng, Yi, Britz, David A., Krause, Stephen, Sreenivasan, Raghav, Chudzik, Michael, Kengeri, Subi, Krishnan, Siddarth, Bazizi, El Mehdi
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
GAA Technology Innovations for 2nm Logic node and Beyond
Bazizi, El Mehdi, Costrini, Gregory, Pal, Ashish, Vyas, Pratik B., Dag, Sefa, Zhao, Charisse, Jadaun, Priyamvada
Published in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (03.03.2024)
Published in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (03.03.2024)
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Conference Proceeding