Deviation-Based LFSR Reseeding for Test-Data Compression
Zhanglei Wang, Hongxia Fang, Chakrabarty, K., Bienek, M.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.2009)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.2009)
Get full text
Journal Article
Test Data Compression Using Selective Encoding of Scan Slices
Zhanglei Wang, Chakrabarty, K.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2008)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2008)
Get full text
Journal Article
Physical-Defect Modeling and Optimization for Fault-Insertion Test
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Chakrabarty, K.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2012)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2012)
Get full text
Journal Article
Board-level fault diagnosis using Bayesian inference
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Chakrabarty, Krishnendu
Published in 2010 28th VLSI Test Symposium (VTS) (01.04.2010)
Published in 2010 28th VLSI Test Symposium (VTS) (01.04.2010)
Get full text
Conference Proceeding
Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks
Zhaobo Zhang, Chakrabarty, K., Zhanglei Wang, Zhiyuan Wang, Xinli Gu
Published in 2011 IEEE International Test Conference (01.09.2011)
Published in 2011 IEEE International Test Conference (01.09.2011)
Get full text
Conference Proceeding
Board-level fault diagnosis using an error-flow dictionary
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Chakrabarty, K
Published in 2010 IEEE International Test Conference (01.11.2010)
Published in 2010 IEEE International Test Conference (01.11.2010)
Get full text
Conference Proceeding
Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Chakrabarty, K
Published in 2010 19th IEEE Asian Test Symposium (01.12.2010)
Published in 2010 19th IEEE Asian Test Symposium (01.12.2010)
Get full text
Conference Proceeding
Physical defect modeling for fault insertion in system reliability test
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Chakrabarty, K.
Published in 2009 International Test Conference (01.11.2009)
Published in 2009 International Test Conference (01.11.2009)
Get full text
Conference Proceeding
SoC Testing Using LFSR Reseeding, and Scan-Slice- Based TAM Optimization and Test Scheduling
Zhanglei Wang, Chakrabarty, K., Seongmoon Wang
Published in 2007 Design, Automation & Test in Europe Conference & Exhibition (01.04.2007)
Published in 2007 Design, Automation & Test in Europe Conference & Exhibition (01.04.2007)
Get full text
Conference Proceeding
A low cost test data compression technique for high n-detection fault coverage
Seongmoon Wang, Zhanglei Wang, Wenlong Wei, Chakradhar, S.T.
Published in 2007 IEEE International Test Conference (01.10.2007)
Published in 2007 IEEE International Test Conference (01.10.2007)
Get full text
Conference Proceeding
Diagnostic system based on support-vector machines for board-level functional diagnosis
Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Chakrabarty, K.
Published in 2012 17th IEEE European Test Symposium (ETS) (01.05.2012)
Published in 2012 17th IEEE European Test Symposium (ETS) (01.05.2012)
Get full text
Conference Proceeding
A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression
Zhanglei Wang, Chakrabarty, K., Bienek, M.
Published in 12th IEEE European Test Symposium (ETS'07) (01.05.2007)
Published in 12th IEEE European Test Symposium (ETS'07) (01.05.2007)
Get full text
Conference Proceeding