At-wavelength metrology facility for soft X-ray reflection optics
Sokolov, A, Bischoff, P, Eggenstein, F, Erko, A, Gaupp, A, Künstner, S, Mast, M, Schmidt, J-S, Senf, F, Siewert, F, Zeschke, Th, Schäfers, F
Published in Review of scientific instruments (01.05.2016)
Published in Review of scientific instruments (01.05.2016)
Get more information
Journal Article
First results of the soft X-ray microfocus beamline U41-PGM
Jung, Ch, Eggenstein, F., Hartlaub, S., Follath, R., Schmidt, J.S., Senf, F., Weiss, M.R., Zeschke, Th, Gudat, W.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.07.2001)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.07.2001)
Get full text
Journal Article
The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II
Schäfers, F., Bischoff, P., Eggenstein, F., Erko, A., Gaupp, A., Künstner, S., Mast, M., Schmidt, J.-S., Senf, F., Siewert, F., Sokolov, A., Zeschke, Th
Published in Journal of synchrotron radiation (01.01.2016)
Published in Journal of synchrotron radiation (01.01.2016)
Get full text
Journal Article