Highly Manufacturable Double-Gate FinFET With Gate-Source/Drain Underlap
Ji-Woon Yang, Zeitzoff, P.M., Hsing-Huang Tseng
Published in IEEE transactions on electron devices (01.06.2007)
Published in IEEE transactions on electron devices (01.06.2007)
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Journal Article
The impact of high-κ gate dielectrics and metal gate electrodes on sub-100 nm MOSFETs
Cheng, B., Cao, M., Rao, R., Inani, A., Vande Voorde, P., Greene, W.M., Stork, J.M.C., Zhiping Yu, Zeitzoff, P.M., Woo, J.C.S.
Published in IEEE transactions on electron devices (01.07.1999)
Published in IEEE transactions on electron devices (01.07.1999)
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Journal Article
Source/Drain Parasitic Resistance Role and Electrical Coupling Effect in sub 50nm MOSFET Design
Yuan, J., Zeitoff, P.M., Woo, J.C.S.
Published in 32nd European Solid-State Device Research Conference (2002)
Published in 32nd European Solid-State Device Research Conference (2002)
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Conference Proceeding
Subnanometer scaling of HfO2/metal electrode gate stacks
Peterson, Jeff J, Young, Chadwin D, Barnett, Joel, Gopalan, Sundar, Gutt, Jim, Lee, Choong-Ho, Li, Hong-Jyh, Hou, Luo-Hung, Kim, Yudong, Lim, Chan, Chaudhary, Nirmal, Moumen, Naim, Lee, Byoung-Hun, Bersuker, Gennadi, Brown, George A, Zeitzoff, Peter M
Published in Electrochemical and solid-state letters (01.01.2004)
Published in Electrochemical and solid-state letters (01.01.2004)
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Journal Article
An improved electron and hole mobility model for general purpose device simulation
Darwish, M.N., Lentz, J.L., Pinto, M.R., Zeitzoff, P.M., Krutsick, T.J., Hong Ha Vuong
Published in IEEE transactions on electron devices (01.09.1997)
Published in IEEE transactions on electron devices (01.09.1997)
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Journal Article
Correcting effective mobility measurements for the presence of significant gate leakage current
Zeitzoff, P.M., Young, C.D., Brown, G.A., Yudong Kim
Published in IEEE electron device letters (01.04.2003)
Published in IEEE electron device letters (01.04.2003)
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Journal Article
Subnanometer Scaling of HfO[sub 2]/Metal Electrode Gate Stacks
Peterson, Jeff J., Young, Chadwin D., Barnett, Joel, Gopalan, Sundar, Gutt, Jim, Lee, Choong-Ho, Li, Hong-Jyh, Hou, Tuo-Hung, Kim, Yudong, Lim, Chan, Chaudhary, Nirmal, Moumen, Naim, Lee, Byoung-Hun, Bersuker, Gennadi, Brown, George A., Zeitzoff, Peter M., Gardner, Mark I., Murto, Robert W., Huff, Howard R.
Published in Electrochemical and solid-state letters (2004)
Published in Electrochemical and solid-state letters (2004)
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Journal Article
INTEGRATED CIRCUIT STRUCTURE WITH STEPPED EPITAXIAL REGION
Suvarna, Puneet H, Zeitzoff, Peter M, Bentley, Steven, Raymond, Mark V
Year of Publication 20.12.2018
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Year of Publication 20.12.2018
Patent
Integrated circuit structure with stepped epitaxial region
Suvarna, Puneet H, Zeitzoff, Peter M, Bentley, Steven, Raymond, Mark V
Year of Publication 18.12.2018
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Year of Publication 18.12.2018
Patent
CMOSFET scaling through the end of the roadmap
Zeitzoff, P.M.
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (01.10.2006)
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (01.10.2006)
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Conference Proceeding
A simplified approach for quasi-three-dimensional modeling of npn transistors
Zeitzoff, P.M.
Published in 1989 Proceedings of the IEEE Custom Integrated Circuits Conference (1989)
Published in 1989 Proceedings of the IEEE Custom Integrated Circuits Conference (1989)
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Conference Proceeding
Technology and Reliability Challenges of Sub-nm High EOT High-k/ Metal Gate Electrode Transistors
Peterson, Jeff, Kirsch, Paul, Bersuker, Gennadi, Krishnan, Siddarth, Mahji, Prashant, Lysaght, Pat, Quevedo-Lopez, Manuel, Li, Hong-Jyh, Senzaki, Yoshi, Harris, Rusty, Young, Chadwin D., Choi, Rino, Sim, Johnny, Barnett, Joel, Moumen, Naim, Huffman, Craig, Gardner, Mark I., Brown, George A., Zeitzoff, Peter M., Lee, Byoung-Hun, Ramiller, Chuck, Huff, Howard R.
Published in Meeting abstracts (Electrochemical Society) (22.02.2006)
Published in Meeting abstracts (Electrochemical Society) (22.02.2006)
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Journal Article