Van Gogh’s painting grounds: an examination of barium sulphate extender using analytical electron microscopy – SEM/FIB/TEM/EDX
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Conference Proceeding
Development of an Ion Optical System to transfer Secondary Ions from the Sample to an Ion Trap Mass Spectrometer
Schröppel, B, Plies, E, Burkhardt, C, Brekenfeld, A, Zeile, U, Gnauck, P
Published in Microscopy and microanalysis (01.09.2007)
Published in Microscopy and microanalysis (01.09.2007)
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Journal Article
Focused Ion Beam Preparation Techniques for EFTEM Analysis
Gnauck, P., Zeile, U., Benner, G., Orchowski, A., Rau, W-D.
Published in Microscopy and microanalysis (01.08.2003)
Published in Microscopy and microanalysis (01.08.2003)
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